APA (7th ed.) Citation

Ebner, R., Kubicek, B., Újvári, G., Novalin, S., Rennhofer, M., & Halwachs, M. Optical Characterization of Different Thin Film Module Technologies. Wiley.

Chicago Style (17th ed.) Citation

Ebner, R., B. Kubicek, G. Újvári, S. Novalin, M. Rennhofer, and M. Halwachs. Optical Characterization of Different Thin Film Module Technologies. Wiley.

MLA (9th ed.) Citation

Ebner, R., et al. Optical Characterization of Different Thin Film Module Technologies. Wiley.