Formation Features of the Porous Silicon Layers Modified by НСl and HBr in the Context of Optical Properties
Transmission and reflection spectra, refraction factor of the porous silicon layers produced in HF(48%): HCl:H2O and HF(48%):HBr:H2O solutions are investigated by the sample illumination and without it. It is established that layers produced by electrolytic anodizing in HF(48%):HBr:H2O = 16:2:80 mas...
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| Format: | Article |
| Language: | English |
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Sumy State University
2012-06-01
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| Series: | Журнал нано- та електронної фізики |
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| Online Access: | http://jnep.sumdu.edu.ua/download/numbers/2012/2/articles/jnep_2012_V4_02036.pdf |
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| _version_ | 1849697217503297536 |
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| author | Е.I. Zubko |
| author_facet | Е.I. Zubko |
| author_sort | Е.I. Zubko |
| collection | DOAJ |
| description | Transmission and reflection spectra, refraction factor of the porous silicon layers produced in HF(48%): HCl:H2O and HF(48%):HBr:H2O solutions are investigated by the sample illumination and without it. It is established that layers produced by electrolytic anodizing in HF(48%):HBr:H2O = 16:2:80 mass% solution have the best antireflective characteristics and smaller optical transmission than other samples. |
| format | Article |
| id | doaj-art-6fb4bb86cb504fd2b8e0a93f70f0b29d |
| institution | DOAJ |
| issn | 2077-6772 |
| language | English |
| publishDate | 2012-06-01 |
| publisher | Sumy State University |
| record_format | Article |
| series | Журнал нано- та електронної фізики |
| spelling | doaj-art-6fb4bb86cb504fd2b8e0a93f70f0b29d2025-08-20T03:19:15ZengSumy State UniversityЖурнал нано- та електронної фізики2077-67722012-06-0142020361Formation Features of the Porous Silicon Layers Modified by НСl and HBr in the Context of Optical PropertiesЕ.I. ZubkoTransmission and reflection spectra, refraction factor of the porous silicon layers produced in HF(48%): HCl:H2O and HF(48%):HBr:H2O solutions are investigated by the sample illumination and without it. It is established that layers produced by electrolytic anodizing in HF(48%):HBr:H2O = 16:2:80 mass% solution have the best antireflective characteristics and smaller optical transmission than other samples.http://jnep.sumdu.edu.ua/download/numbers/2012/2/articles/jnep_2012_V4_02036.pdfPorous siliconModificationPhotoanodizingReflectio |
| spellingShingle | Е.I. Zubko Formation Features of the Porous Silicon Layers Modified by НСl and HBr in the Context of Optical Properties Журнал нано- та електронної фізики Porous silicon Modification Photoanodizing Reflectio |
| title | Formation Features of the Porous Silicon Layers Modified by НСl and HBr in the Context of Optical Properties |
| title_full | Formation Features of the Porous Silicon Layers Modified by НСl and HBr in the Context of Optical Properties |
| title_fullStr | Formation Features of the Porous Silicon Layers Modified by НСl and HBr in the Context of Optical Properties |
| title_full_unstemmed | Formation Features of the Porous Silicon Layers Modified by НСl and HBr in the Context of Optical Properties |
| title_short | Formation Features of the Porous Silicon Layers Modified by НСl and HBr in the Context of Optical Properties |
| title_sort | formation features of the porous silicon layers modified by нсl and hbr in the context of optical properties |
| topic | Porous silicon Modification Photoanodizing Reflectio |
| url | http://jnep.sumdu.edu.ua/download/numbers/2012/2/articles/jnep_2012_V4_02036.pdf |
| work_keys_str_mv | AT eizubko formationfeaturesoftheporoussiliconlayersmodifiedbynslandhbrinthecontextofopticalproperties |