Impact of JPEG compression on the metrological characteristics of industrial CT data
The basis of metrology with computed tomography (CT) are volume datasets with increasing sizes in the two- or three-digit GB range due to the increasing detector resolutions in the double-digit MPixel range. Handling these large amounts of data poses a considerable challenge in metrology in terms o...
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| Main Authors: | Steffen Kieß, Robin Trostorf, Hieu Tran, Jajnabalkya Guhathakurta, Sven Simon, Ulrich Neuschaefer-Rube |
|---|---|
| Format: | Article |
| Language: | deu |
| Published: |
NDT.net
2025-02-01
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| Series: | e-Journal of Nondestructive Testing |
| Online Access: | https://www.ndt.net/search/docs.php3?id=30716 |
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