3 300 V IGBT Based on Enhanced Trench Metal Oxide Semiconductor Technology with High Performance
It developed a new enhanced trench metal oxide semiconductor (TMOS+) 3 300 V IGBT with soft punch through (SPT) concept and n-well layer. Its on-state voltage (Tj=150 ℃ ) is 25% lower than that of 3 300 V planar enhanced double diffused metal oxide semiconductor (DMOS+) IGBT, and its reverse bias sa...
Saved in:
| Main Authors: | ZHOU Feiyu, NING Xubin, Luther Ngwendson, XIAO Qiang, Ian Deviny, DAI Xiaoping |
|---|---|
| Format: | Article |
| Language: | zho |
| Published: |
Editorial Office of Control and Information Technology
2017-01-01
|
| Series: | Kongzhi Yu Xinxi Jishu |
| Subjects: | |
| Online Access: | http://ctet.csrzic.com/thesisDetails#10.13889/j.issn.2095-3631.2017.05.011 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Investigation of Deep Trench Process for Trench-gate IGBT
by: LUO Haihui, et al.
Published: (2013-01-01) -
Influence of Device Design Parameters on Static and Dynamic Performances of Trench Gate IGBT
by: Luther Ngwendson
Published: (2017-01-01) -
Effect of P-well Interconnection in Dummy Trench Area on Properties of Trench IGBT
by: LUO Haihui, et al.
Published: (2016-01-01) -
Research on the Key Technology of Trench Gate IGBT
by: HUANG Jianwei, et al.
Published: (2015-01-01) -
Simulation Study on 6.5 kV SiC Trench Gate p-Channel Superjunction Insulated Gate Bipolar Transistor
by: Kuan-Min Kang, et al.
Published: (2025-06-01)