Total Ionizing Dose and Single-Event Effect Response of the AD524CDZ Instrumentation Amplifier
This manuscript focuses on studying the radiation response of the Commercial-off-the-shelf (COTS) AD524CDZ operational amplifier. Total Ionizing Dose (TID) effects were tested using low-dose <sup>60</sup>Co irradiation. Single-Event Effect (SEE) sensitivity was studied on this operationa...
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2024-09-01
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| Series: | Energies |
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| Online Access: | https://www.mdpi.com/1996-1073/17/18/4725 |
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| author | Jaime Cardenas Chavez Dave Hiemstra Adriana Noguera Cundar Brayden Johnson David Baik Li Chen |
| author_facet | Jaime Cardenas Chavez Dave Hiemstra Adriana Noguera Cundar Brayden Johnson David Baik Li Chen |
| author_sort | Jaime Cardenas Chavez |
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| description | This manuscript focuses on studying the radiation response of the Commercial-off-the-shelf (COTS) AD524CDZ operational amplifier. Total Ionizing Dose (TID) effects were tested using low-dose <sup>60</sup>Co irradiation. Single-Event Effect (SEE) sensitivity was studied on this operational amplifier using a 105 MeV proton beam. Additionally, further study of the SEE response was carried out using a Two-photon absorption laser to scan some sensitive sectors of the die. For this laser experiment, different gain setups and laser energies were employed to determine how the Single Event Transient (SET) response of the device was affected based on the test configuration. The results from the TID experiments revealed that the studied device remained functional after 100 krads (Si). Proton experiments revealed the studied device exhibited a high SET response with a maximum DC offset SET of about 1.5 V. Laser experiments demonstrated that there was a clear SET reduction when using 10× and 1000× gain setups. |
| format | Article |
| id | doaj-art-6afba0920cd1437bb45dfada04bd0302 |
| institution | OA Journals |
| issn | 1996-1073 |
| language | English |
| publishDate | 2024-09-01 |
| publisher | MDPI AG |
| record_format | Article |
| series | Energies |
| spelling | doaj-art-6afba0920cd1437bb45dfada04bd03022025-08-20T01:55:30ZengMDPI AGEnergies1996-10732024-09-011718472510.3390/en17184725Total Ionizing Dose and Single-Event Effect Response of the AD524CDZ Instrumentation AmplifierJaime Cardenas Chavez0Dave Hiemstra1Adriana Noguera Cundar2Brayden Johnson3David Baik4Li Chen5Department of Electrical & Computer Engineering, University of Saskatchewan, Saskatoon, SK S7N 5A9, CanadaMDA, Brampton, ON L6S 4J3, CanadaDepartment of Electrical & Computer Engineering, University of Saskatchewan, Saskatoon, SK S7N 5A9, CanadaDepartment of Electrical & Computer Engineering, University of Saskatchewan, Saskatoon, SK S7N 5A9, CanadaDepartment of Electrical & Computer Engineering, University of Saskatchewan, Saskatoon, SK S7N 5A9, CanadaDepartment of Electrical & Computer Engineering, University of Saskatchewan, Saskatoon, SK S7N 5A9, CanadaThis manuscript focuses on studying the radiation response of the Commercial-off-the-shelf (COTS) AD524CDZ operational amplifier. Total Ionizing Dose (TID) effects were tested using low-dose <sup>60</sup>Co irradiation. Single-Event Effect (SEE) sensitivity was studied on this operational amplifier using a 105 MeV proton beam. Additionally, further study of the SEE response was carried out using a Two-photon absorption laser to scan some sensitive sectors of the die. For this laser experiment, different gain setups and laser energies were employed to determine how the Single Event Transient (SET) response of the device was affected based on the test configuration. The results from the TID experiments revealed that the studied device remained functional after 100 krads (Si). Proton experiments revealed the studied device exhibited a high SET response with a maximum DC offset SET of about 1.5 V. Laser experiments demonstrated that there was a clear SET reduction when using 10× and 1000× gain setups.https://www.mdpi.com/1996-1073/17/18/4725total ionizing dose (TID)<sup>60</sup>Cosingle-event effect (SEE)single-event transient (SET)proton beamtwo-photon absorption laser |
| spellingShingle | Jaime Cardenas Chavez Dave Hiemstra Adriana Noguera Cundar Brayden Johnson David Baik Li Chen Total Ionizing Dose and Single-Event Effect Response of the AD524CDZ Instrumentation Amplifier Energies total ionizing dose (TID) <sup>60</sup>Co single-event effect (SEE) single-event transient (SET) proton beam two-photon absorption laser |
| title | Total Ionizing Dose and Single-Event Effect Response of the AD524CDZ Instrumentation Amplifier |
| title_full | Total Ionizing Dose and Single-Event Effect Response of the AD524CDZ Instrumentation Amplifier |
| title_fullStr | Total Ionizing Dose and Single-Event Effect Response of the AD524CDZ Instrumentation Amplifier |
| title_full_unstemmed | Total Ionizing Dose and Single-Event Effect Response of the AD524CDZ Instrumentation Amplifier |
| title_short | Total Ionizing Dose and Single-Event Effect Response of the AD524CDZ Instrumentation Amplifier |
| title_sort | total ionizing dose and single event effect response of the ad524cdz instrumentation amplifier |
| topic | total ionizing dose (TID) <sup>60</sup>Co single-event effect (SEE) single-event transient (SET) proton beam two-photon absorption laser |
| url | https://www.mdpi.com/1996-1073/17/18/4725 |
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