Characterization of cryo-cooled silicon crystal monochromators via measurement of flux versus power

A study on the thermal load of cryogenically cooled silicon in synchrotron double-crystal monochromators is presented, based on experimental data from four different beamlines at Diamond Light Source. Different amounts of power are deposited on the first monochromator crystal by varying the storage...

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Main Authors: Lucia Alianelli, Hossein Khosroabadi, John Sutter, Andrew C. Walters, Pierpaolo Romano, Kalotina Geraki, Francesco Carlá, Jonathan Rawle, Sarah Barnett, Kawal Sawhney
Format: Article
Language:English
Published: International Union of Crystallography 2025-07-01
Series:Journal of Synchrotron Radiation
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Online Access:https://journals.iucr.org/paper?S160057752500342X
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author Lucia Alianelli
Hossein Khosroabadi
John Sutter
Andrew C. Walters
Pierpaolo Romano
Kalotina Geraki
Francesco Carlá
Jonathan Rawle
Sarah Barnett
Kawal Sawhney
author_facet Lucia Alianelli
Hossein Khosroabadi
John Sutter
Andrew C. Walters
Pierpaolo Romano
Kalotina Geraki
Francesco Carlá
Jonathan Rawle
Sarah Barnett
Kawal Sawhney
author_sort Lucia Alianelli
collection DOAJ
description A study on the thermal load of cryogenically cooled silicon in synchrotron double-crystal monochromators is presented, based on experimental data from four different beamlines at Diamond Light Source. Different amounts of power are deposited on the first monochromator crystal by varying the storage ring current. The resulting crystal deformation causes a decline in the diffraction efficiency when power and power density are above threshold values. The results are compatible with an analytical model of thermo-mechanical deformation. Acceptable monochromator heat load values are determined with this model, to ensure optimal function of the monochromator. This model, previously tested against finite element analyses, is now validated against measured data and it will be used as a tool for initial analysis of monochromator performance on upgraded photon sources.
format Article
id doaj-art-6aa295779fb844e2bdc0b545e6ae8b71
institution Kabale University
issn 1600-5775
language English
publishDate 2025-07-01
publisher International Union of Crystallography
record_format Article
series Journal of Synchrotron Radiation
spelling doaj-art-6aa295779fb844e2bdc0b545e6ae8b712025-08-20T03:33:13ZengInternational Union of CrystallographyJournal of Synchrotron Radiation1600-57752025-07-0132491992310.1107/S160057752500342Xtol5009Characterization of cryo-cooled silicon crystal monochromators via measurement of flux versus powerLucia Alianelli0Hossein Khosroabadi1John Sutter2Andrew C. Walters3Pierpaolo Romano4Kalotina Geraki5Francesco Carlá6Jonathan Rawle7Sarah Barnett8Kawal Sawhney9Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United KingdomDiamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United KingdomDiamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United KingdomDiamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United KingdomDiamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United KingdomDiamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United KingdomDiamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United KingdomDiamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United KingdomDiamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United KingdomDiamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United KingdomA study on the thermal load of cryogenically cooled silicon in synchrotron double-crystal monochromators is presented, based on experimental data from four different beamlines at Diamond Light Source. Different amounts of power are deposited on the first monochromator crystal by varying the storage ring current. The resulting crystal deformation causes a decline in the diffraction efficiency when power and power density are above threshold values. The results are compatible with an analytical model of thermo-mechanical deformation. Acceptable monochromator heat load values are determined with this model, to ensure optimal function of the monochromator. This model, previously tested against finite element analyses, is now validated against measured data and it will be used as a tool for initial analysis of monochromator performance on upgraded photon sources.https://journals.iucr.org/paper?S160057752500342Xsilicon crystal monochromatorindirect cryo-coolingfinite element analysisoptics thermal deformation
spellingShingle Lucia Alianelli
Hossein Khosroabadi
John Sutter
Andrew C. Walters
Pierpaolo Romano
Kalotina Geraki
Francesco Carlá
Jonathan Rawle
Sarah Barnett
Kawal Sawhney
Characterization of cryo-cooled silicon crystal monochromators via measurement of flux versus power
Journal of Synchrotron Radiation
silicon crystal monochromator
indirect cryo-cooling
finite element analysis
optics thermal deformation
title Characterization of cryo-cooled silicon crystal monochromators via measurement of flux versus power
title_full Characterization of cryo-cooled silicon crystal monochromators via measurement of flux versus power
title_fullStr Characterization of cryo-cooled silicon crystal monochromators via measurement of flux versus power
title_full_unstemmed Characterization of cryo-cooled silicon crystal monochromators via measurement of flux versus power
title_short Characterization of cryo-cooled silicon crystal monochromators via measurement of flux versus power
title_sort characterization of cryo cooled silicon crystal monochromators via measurement of flux versus power
topic silicon crystal monochromator
indirect cryo-cooling
finite element analysis
optics thermal deformation
url https://journals.iucr.org/paper?S160057752500342X
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