Measurement of aluminum oxide film by FabryâPérot interferometry and scanning electron microscopy
A novel experimental scheme for real time measurement of aluminum oxide film during anodization was developed for the first time. The scheme was established based on a combination of a fiber optic sensor of FabryâPérot interferometry and direct current (DC) electrochemical methods. The scheme was a...
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| Format: | Article |
| Language: | English |
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Springer
2017-12-01
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| Series: | Journal of Saudi Chemical Society |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S1319610316000223 |
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| author | Farzia Karim Tanujjal Bora Mayur Chaudhari Khaled Habib Waleed Mohammed Joydeep Dutta |
| author_facet | Farzia Karim Tanujjal Bora Mayur Chaudhari Khaled Habib Waleed Mohammed Joydeep Dutta |
| author_sort | Farzia Karim |
| collection | DOAJ |
| description | A novel experimental scheme for real time measurement of aluminum oxide film during anodization was developed for the first time. The scheme was established based on a combination of a fiber optic sensor of FabryâPérot interferometry and direct current (DC) electrochemical methods. The scheme was assembled in a way to simultaneously anodize the aluminum samples and to measure the thickness of the aluminum oxide film. The anodization process of aluminum sample was carried out in 4% sulfuric acid (H2SO4) solution by the DC methods at room temperature. The estimated thickness of the aluminum oxide film by the novel scheme was verified by scanning electron microscopy (SEM) and electrochemistry measurements. This study shows that real time measurement of the thickness of aluminum oxide film is feasible as it closely matched the thickness determined by SEM and other electrochemistry techniques. Keywords: Aluminum, Aluminum oxide film, FabryâPérot interferometry, Sulfuric acid, Scanning electron microscopy (SEM), Direct current (DC) electrochemical methods |
| format | Article |
| id | doaj-art-6a135da388ce41de95db090078aa590c |
| institution | Kabale University |
| issn | 1319-6103 |
| language | English |
| publishDate | 2017-12-01 |
| publisher | Springer |
| record_format | Article |
| series | Journal of Saudi Chemical Society |
| spelling | doaj-art-6a135da388ce41de95db090078aa590c2025-08-20T03:49:12ZengSpringerJournal of Saudi Chemical Society1319-61032017-12-0121893894210.1016/j.jscs.2016.02.001Measurement of aluminum oxide film by FabryâPérot interferometry and scanning electron microscopyFarzia Karim0Tanujjal Bora1Mayur Chaudhari2Khaled Habib3Waleed Mohammed4Joydeep Dutta5Center of Excellence in Nanotechnology, School of Engineering and Technology, Asian Institute of Technology, Pathum Thani 12120, ThailandCenter of Excellence in Nanotechnology, School of Engineering and Technology, Asian Institute of Technology, Pathum Thani 12120, ThailandCenter of Excellence in Nanotechnology, School of Engineering and Technology, Asian Institute of Technology, Pathum Thani 12120, ThailandMaterials Science and Photo-Electronics Lab., RE Program/EBR Center, KISR, P.O. Box 24885, 13109, Kuwait; Corresponding author.Center of Research in Optoelectronics, Communication and Control System, School of Engineering, Bangkok University, Pathum Thani 12120, ThailandChair in Nanotechnology, Water Research Center, Sultan Qaboos University, POB#17, Al-Khodh 123, OmanA novel experimental scheme for real time measurement of aluminum oxide film during anodization was developed for the first time. The scheme was established based on a combination of a fiber optic sensor of FabryâPérot interferometry and direct current (DC) electrochemical methods. The scheme was assembled in a way to simultaneously anodize the aluminum samples and to measure the thickness of the aluminum oxide film. The anodization process of aluminum sample was carried out in 4% sulfuric acid (H2SO4) solution by the DC methods at room temperature. The estimated thickness of the aluminum oxide film by the novel scheme was verified by scanning electron microscopy (SEM) and electrochemistry measurements. This study shows that real time measurement of the thickness of aluminum oxide film is feasible as it closely matched the thickness determined by SEM and other electrochemistry techniques. Keywords: Aluminum, Aluminum oxide film, FabryâPérot interferometry, Sulfuric acid, Scanning electron microscopy (SEM), Direct current (DC) electrochemical methodshttp://www.sciencedirect.com/science/article/pii/S1319610316000223 |
| spellingShingle | Farzia Karim Tanujjal Bora Mayur Chaudhari Khaled Habib Waleed Mohammed Joydeep Dutta Measurement of aluminum oxide film by FabryâPérot interferometry and scanning electron microscopy Journal of Saudi Chemical Society |
| title | Measurement of aluminum oxide film by FabryâPérot interferometry and scanning electron microscopy |
| title_full | Measurement of aluminum oxide film by FabryâPérot interferometry and scanning electron microscopy |
| title_fullStr | Measurement of aluminum oxide film by FabryâPérot interferometry and scanning electron microscopy |
| title_full_unstemmed | Measurement of aluminum oxide film by FabryâPérot interferometry and scanning electron microscopy |
| title_short | Measurement of aluminum oxide film by FabryâPérot interferometry and scanning electron microscopy |
| title_sort | measurement of aluminum oxide film by fabryapa c rot interferometry and scanning electron microscopy |
| url | http://www.sciencedirect.com/science/article/pii/S1319610316000223 |
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