Interface Engineering and Gate Dielectric Engineering for High Performance Ge MOSFETs
In recent years, germanium has attracted intensive interests for its promising applications in the microelectronics industry. However, to achieve high performance Ge channel devices, several critical issues still have to be addressed. Amongst them, a high quality gate stack, that is, a low defect in...
Saved in:
| Main Authors: | Jiabao Sun, Jiwu Lu |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Wiley
2015-01-01
|
| Series: | Advances in Condensed Matter Physics |
| Online Access: | http://dx.doi.org/10.1155/2015/639218 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
Gate Dielectric Engineering Using Stacked Gate Dielectric in U-Shaped Gate Tunnel FET
by: Sina Mehrad, et al.
Published: (2025-01-01) -
Performance enhancement of triple material staggered heterojunction double gate MOSFET (TM-SH-DGMOS) with gate engineering
by: Prasanta Ku Khuntia, et al.
Published: (2025-06-01) -
On the Evaluation of Gate Dielectrics for 4H-SiC Based Power MOSFETs
by: Muhammad Nawaz
Published: (2015-01-01) -
Improvement of the perovskite photodiodes performance via advanced interface engineering with polymer dielectric
by: Andrey P. Morozov, et al.
Published: (2025-04-01) -
A temperature dependent analytical model & performance evaluation of triple-material dielectric-pocket gate-all-around MOSFET
by: Neeraj Gupta, et al.
Published: (2024-12-01)