APA (7th ed.) Citation

Yarenscruz, Y. J., Castano, F., Villalonga, A., Mishra, M., & Haber, R. E. A Data-Driven Approach for Predicting Remaining Useful Life of Semiconductor Devices Based on Machine Learning and Synthetic Data Generation: A Review and Case Study on SiC MOSFETs. IEEE.

Chicago Style (17th ed.) Citation

Yarenscruz, Yarens J., Fernando Castano, Alberto Villalonga, Madhav Mishra, and Rodolfo E. Haber. A Data-Driven Approach for Predicting Remaining Useful Life of Semiconductor Devices Based on Machine Learning and Synthetic Data Generation: A Review and Case Study on SiC MOSFETs. IEEE.

MLA (9th ed.) Citation

Yarenscruz, Yarens J., et al. A Data-Driven Approach for Predicting Remaining Useful Life of Semiconductor Devices Based on Machine Learning and Synthetic Data Generation: A Review and Case Study on SiC MOSFETs. IEEE.