Generation and Classification of Novel Segmented Control Charts (SCC) Based on Hu’s Invariant Moments and the K-Means Algorithm
Control charts (CCs) are one of the most important techniques in statistical process control (SPC) used to monitor the behavior of critical variables. SPC is based on the averages of the samples taken. In this way, not every measurement is observed, and errors in measurements or out-of-control behav...
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| Format: | Article |
| Language: | English |
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MDPI AG
2025-08-01
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| Series: | Applied Sciences |
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| Online Access: | https://www.mdpi.com/2076-3417/15/15/8550 |
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