Arranging a Pool of Functional Test Sequences for Variable In-Field Test Periods
High workloads applied to a system cause chips to be more susceptible to aging effects that may eventually result in hardware defects. The detection of the defects requires tests for delay faults to be applied in-field. Both scan-based tests and functional test sequences are important to apply. In-f...
Saved in:
| Main Author: | |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
|
| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/10838502/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|