APA (7th ed.) Citation

JIANG, H., LI, B., WANG, X., CHEN, J., & GUO, Y. Robustness test method for intelligent electronic device. Beijing Xintong Media Co., Ltd.

Chicago Style (17th ed.) Citation

JIANG, Haitao, Bin LI, Xiang WANG, Jinming CHEN, and Yajuan GUO. Robustness Test Method for Intelligent Electronic Device. Beijing Xintong Media Co., Ltd.

MLA (9th ed.) Citation

JIANG, Haitao, et al. Robustness Test Method for Intelligent Electronic Device. Beijing Xintong Media Co., Ltd.