PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1

PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1

Methods for modern memory devices are analyzed. The validity of using pseudo-exhaustive tests to detect complex memory faults is shown. A necessary condition for generating a pseudo-exhaustive test for a given number of memory cells is formulated. It is shown that the problem of generating a pseudo-...

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Bibliographic Details
Main Authors: V. N. Yarmolik, I. Mrozek, B. A. Levantsevich
Format: Article
Language:Russian
Published: National Academy of Sciences of Belarus, the United Institute of Informatics Problems 2018-03-01
Series:Informatika
Subjects:
march tests
pseudo-exhaustive tests
coupon collector problem
Online Access:https://inf.grid.by/jour/article/view/321
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