PSEUDO-EXHAUSTIVE MEMORY DEVICES TESTING BASED ON MULTIPLE MARCH TESTS 1
Methods for modern memory devices are analyzed. The validity of using pseudo-exhaustive tests to detect complex memory faults is shown. A necessary condition for generating a pseudo-exhaustive test for a given number of memory cells is formulated. It is shown that the problem of generating a pseudo-...
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | Russian |
| Published: |
National Academy of Sciences of Belarus, the United Institute of Informatics Problems
2018-03-01
|
| Series: | Informatika |
| Subjects: | |
| Online Access: | https://inf.grid.by/jour/article/view/321 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Summary: | Methods for modern memory devices are analyzed. The validity of using pseudo-exhaustive tests to detect complex memory faults is shown. A necessary condition for generating a pseudo-exhaustive test for a given number of memory cells is formulated. It is shown that the problem of generating a pseudo-exhaustive test based on multiple memory tests with a variable background is reduced to the combinatorial task of the coupon collector. Estimates of the mean, minimum, and maximum multiplicity of a multiple test are given to provide an exhaustive set of combinations for a given number of cells of a memory device. The validity of analytical estimates is shown experimentally and the possibility of pseudo-exhaustive memory testing is confirmed. |
|---|---|
| ISSN: | 1816-0301 |