A study on the influence of turn-on pulse width on double pulse testing for power semiconductor device
In order to better carry out double pulse testing for power semiconductor devices, the influence of the turn-on pulse width on DPT (double pulse testing) of power semiconductor devices is investigated systematically in the paper. The relationship between switching characteristics of IGBT and MOSFET...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | zho |
| Published: |
Editorial Department of Electric Drive for Locomotives
2023-09-01
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| Series: | 机车电传动 |
| Subjects: | |
| Online Access: | http://edl.csrzic.com/thesisDetails#10.13890/j.issn.1000-128X.2023.05.017 |
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