Growth and Properties of (Yb-Er) Co-Doped ZnO Thin Films Deposited via Spray Pyrolysis Technique
Yb<sub>x</sub>Er<sub>y</sub>ZnO thin films with a low concentration (x = 5%, y = 0, 1, 3%) were made on glass substrates using the spray pyrolysis method. The films were characterized through the use of specific techniques to investigate their structural, optical, and electri...
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2025-04-01
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| Series: | Optics |
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| author | Abderrahim El Hat Imane Chaki Rida Essajai Abdelmajid Fakhim Lamrani Boubker Fares Mohammed Regragui Aziz Dinia Mohammed Abd-Lefdil |
| author_facet | Abderrahim El Hat Imane Chaki Rida Essajai Abdelmajid Fakhim Lamrani Boubker Fares Mohammed Regragui Aziz Dinia Mohammed Abd-Lefdil |
| author_sort | Abderrahim El Hat |
| collection | DOAJ |
| description | Yb<sub>x</sub>Er<sub>y</sub>ZnO thin films with a low concentration (x = 5%, y = 0, 1, 3%) were made on glass substrates using the spray pyrolysis method. The films were characterized through the use of specific techniques to investigate their structural, optical, and electrical properties. The XRD structural analysis of the films revealed that they are polycrystalline with a hexagonal wurtzite structure and a preferential orientation in the (002) direction. The optical characterization of the co-doped layers in the range of 200 to 800 nm revealed that co-doping had a significant impact on the values of transmission. A well-defined peak in the infrared domain centered around 980 nm was observed in photoluminescence measurements. This peak signifies the transition between the electronic levels <sup>2</sup>F<sub>5/2</sub> (ground state) and <sup>2</sup>F<sub>7/2</sub> (excited state), proving that photons are efficiently transferred between the ZnO matrix and the Yb<sup>3+</sup> ion. All layers exhibited n-type conduction and an electrical resistivity decrease to 6.0 × 10<sup>−2</sup> Ω cm according to Hall effect measurements at room temperature. |
| format | Article |
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| institution | Kabale University |
| issn | 2673-3269 |
| language | English |
| publishDate | 2025-04-01 |
| publisher | MDPI AG |
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| series | Optics |
| spelling | doaj-art-64bc1a97d7e44fe9b700889352df23bb2025-08-20T03:27:21ZengMDPI AGOptics2673-32692025-04-01621410.3390/opt6020014Growth and Properties of (Yb-Er) Co-Doped ZnO Thin Films Deposited via Spray Pyrolysis TechniqueAbderrahim El Hat0Imane Chaki1Rida Essajai2Abdelmajid Fakhim Lamrani3Boubker Fares4Mohammed Regragui5Aziz Dinia6Mohammed Abd-Lefdil7Ecole Normale Supérieure (ENS)-Physics Department, Mohammed V University, Rabat 5118, MoroccoMaterials and Nanomaterials for Photovaltaic conversion and and Electrochemical Storage (MANAPSE), Faculty of Sciences, Mohammed V University, Rabat 1014, MoroccoGroup of Semiconductors and Environmental Sensor Technologies, Energy Research Center, Faculty of Science, Mohammed V University, Rabat 1014, MoroccoEcole Normale Supérieure (ENS)-Physics Department, Mohammed V University, Rabat 5118, MoroccoGroup of Semiconductors and Environmental Sensor Technologies, Energy Research Center, Faculty of Science, Mohammed V University, Rabat 1014, MoroccoMaterials and Nanomaterials for Photovaltaic conversion and and Electrochemical Storage (MANAPSE), Faculty of Sciences, Mohammed V University, Rabat 1014, MoroccoInstitute of Physics and Chemistry of Materials of Strasbourg, University of Strasbourg, 67200 Strasbourg, FranceMaterials and Nanomaterials for Photovaltaic conversion and and Electrochemical Storage (MANAPSE), Faculty of Sciences, Mohammed V University, Rabat 1014, MoroccoYb<sub>x</sub>Er<sub>y</sub>ZnO thin films with a low concentration (x = 5%, y = 0, 1, 3%) were made on glass substrates using the spray pyrolysis method. The films were characterized through the use of specific techniques to investigate their structural, optical, and electrical properties. The XRD structural analysis of the films revealed that they are polycrystalline with a hexagonal wurtzite structure and a preferential orientation in the (002) direction. The optical characterization of the co-doped layers in the range of 200 to 800 nm revealed that co-doping had a significant impact on the values of transmission. A well-defined peak in the infrared domain centered around 980 nm was observed in photoluminescence measurements. This peak signifies the transition between the electronic levels <sup>2</sup>F<sub>5/2</sub> (ground state) and <sup>2</sup>F<sub>7/2</sub> (excited state), proving that photons are efficiently transferred between the ZnO matrix and the Yb<sup>3+</sup> ion. All layers exhibited n-type conduction and an electrical resistivity decrease to 6.0 × 10<sup>−2</sup> Ω cm according to Hall effect measurements at room temperature.https://www.mdpi.com/2673-3269/6/2/14YbErZnOrare earththin filmsspray pyrolysis |
| spellingShingle | Abderrahim El Hat Imane Chaki Rida Essajai Abdelmajid Fakhim Lamrani Boubker Fares Mohammed Regragui Aziz Dinia Mohammed Abd-Lefdil Growth and Properties of (Yb-Er) Co-Doped ZnO Thin Films Deposited via Spray Pyrolysis Technique Optics Yb Er ZnO rare earth thin films spray pyrolysis |
| title | Growth and Properties of (Yb-Er) Co-Doped ZnO Thin Films Deposited via Spray Pyrolysis Technique |
| title_full | Growth and Properties of (Yb-Er) Co-Doped ZnO Thin Films Deposited via Spray Pyrolysis Technique |
| title_fullStr | Growth and Properties of (Yb-Er) Co-Doped ZnO Thin Films Deposited via Spray Pyrolysis Technique |
| title_full_unstemmed | Growth and Properties of (Yb-Er) Co-Doped ZnO Thin Films Deposited via Spray Pyrolysis Technique |
| title_short | Growth and Properties of (Yb-Er) Co-Doped ZnO Thin Films Deposited via Spray Pyrolysis Technique |
| title_sort | growth and properties of yb er co doped zno thin films deposited via spray pyrolysis technique |
| topic | Yb Er ZnO rare earth thin films spray pyrolysis |
| url | https://www.mdpi.com/2673-3269/6/2/14 |
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