Liu, Z., Kasugaya, S., & Mishima, N. Detection of Small-Sized Electronics Endangering Facilities Involved in Recycling Processes Using Deep Learning. MDPI AG.
Chicago Style (17th ed.) CitationLiu, Zizhen, Shunki Kasugaya, and Nozomu Mishima. Detection of Small-Sized Electronics Endangering Facilities Involved in Recycling Processes Using Deep Learning. MDPI AG.
MLA (9th ed.) CitationLiu, Zizhen, et al. Detection of Small-Sized Electronics Endangering Facilities Involved in Recycling Processes Using Deep Learning. MDPI AG.
Warning: These citations may not always be 100% accurate.