Correcting for focal spot drift in edge illumination X-ray phase contrast imaging
Edge illumination is an X-ray phase contrast imaging technique that introduces two absorbing masks with slit-shaped apertures in the imaging setup. During an edge illumination acquisition, a pixel-wise intensity profile is measured by acquiring projections at several different mask aperture alignme...
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| Main Authors: | , , , , |
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| Format: | Article |
| Language: | deu |
| Published: |
NDT.net
2025-02-01
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| Series: | e-Journal of Nondestructive Testing |
| Online Access: | https://www.ndt.net/search/docs.php3?id=30746 |
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