Li, C., Li, W., Hao, S., Shi, H., Chen, L., Kong, C., . . . Li, X. Microstructure and mechanical property degradation mechanism of Cu–Cr–Zr rail after extreme electromagnetic launches. Elsevier.
Chicago Style (17th ed.) CitationLi, Chengcheng, Weihao Li, Shiyu Hao, Huantong Shi, Li Chen, Chuncai Kong, Feng Jiang, and Xingwen Li. Microstructure and Mechanical Property Degradation Mechanism of Cu–Cr–Zr Rail After Extreme Electromagnetic Launches. Elsevier.
MLA (9th ed.) CitationLi, Chengcheng, et al. Microstructure and Mechanical Property Degradation Mechanism of Cu–Cr–Zr Rail After Extreme Electromagnetic Launches. Elsevier.
Warning: These citations may not always be 100% accurate.