Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements
Overcoming opaque barriers beyond the penetration depth is based on light-matter interactions, with applications in biomedical optics, material science and security. In wave propagation, scattering is the amount of disorder, mostly treated as a disturbance. Scattered light variations allow overcomin...
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IEEE
2020-01-01
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| Series: | IEEE Photonics Journal |
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| Online Access: | https://ieeexplore.ieee.org/document/9170757/ |
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| author | Inbar Yariv Hamootal Duadi Dror Fixler |
| author_facet | Inbar Yariv Hamootal Duadi Dror Fixler |
| author_sort | Inbar Yariv |
| collection | DOAJ |
| description | Overcoming opaque barriers beyond the penetration depth is based on light-matter interactions, with applications in biomedical optics, material science and security. In wave propagation, scattering is the amount of disorder, mostly treated as a disturbance. Scattered light variations allow overcoming opaque barriers. In order to separate turbid medium layers, absorption-based contrast is commonly used. This paper presents the two-layer study of a noninvasive scattering-based technique. The iterative multi-plane optical property extraction (IMOPE) technique assesses scattering by reconstructing the light phase. The reflection-based IMOPE detects different scattering layers with 0.2 mm<sup>−1</sup> sensitivity at different depths, behind layers up to 6 mm thick. |
| format | Article |
| id | doaj-art-608b65ae63c548059014a73718ca8464 |
| institution | Kabale University |
| issn | 1943-0655 |
| language | English |
| publishDate | 2020-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Photonics Journal |
| spelling | doaj-art-608b65ae63c548059014a73718ca84642025-08-20T03:33:14ZengIEEEIEEE Photonics Journal1943-06552020-01-0112511310.1109/JPHOT.2020.30176979170757Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance MeasurementsInbar Yariv0Hamootal Duadi1Dror Fixler2https://orcid.org/0000-0003-0963-7908Faculty of Engineering and the Institute of Nanotechnology and Advanced Materials, Bar Ilan University, Ramat Gan, IsraelFaculty of Engineering and the Institute of Nanotechnology and Advanced Materials, Bar Ilan University, Ramat Gan, IsraelFaculty of Engineering and the Institute of Nanotechnology and Advanced Materials, Bar Ilan University, Ramat Gan, IsraelOvercoming opaque barriers beyond the penetration depth is based on light-matter interactions, with applications in biomedical optics, material science and security. In wave propagation, scattering is the amount of disorder, mostly treated as a disturbance. Scattered light variations allow overcoming opaque barriers. In order to separate turbid medium layers, absorption-based contrast is commonly used. This paper presents the two-layer study of a noninvasive scattering-based technique. The iterative multi-plane optical property extraction (IMOPE) technique assesses scattering by reconstructing the light phase. The reflection-based IMOPE detects different scattering layers with 0.2 mm<sup>−1</sup> sensitivity at different depths, behind layers up to 6 mm thick.https://ieeexplore.ieee.org/document/9170757/Optical propertiesscatteringGS algorithmturbid mediumdiffusion reflection and multi-layer media |
| spellingShingle | Inbar Yariv Hamootal Duadi Dror Fixler Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements IEEE Photonics Journal Optical properties scattering GS algorithm turbid medium diffusion reflection and multi-layer media |
| title | Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements |
| title_full | Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements |
| title_fullStr | Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements |
| title_full_unstemmed | Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements |
| title_short | Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements |
| title_sort | depth scattering characterization of multi layer turbid media based on iterative multi plane reflectance measurements |
| topic | Optical properties scattering GS algorithm turbid medium diffusion reflection and multi-layer media |
| url | https://ieeexplore.ieee.org/document/9170757/ |
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