Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements

Overcoming opaque barriers beyond the penetration depth is based on light-matter interactions, with applications in biomedical optics, material science and security. In wave propagation, scattering is the amount of disorder, mostly treated as a disturbance. Scattered light variations allow overcomin...

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Main Authors: Inbar Yariv, Hamootal Duadi, Dror Fixler
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9170757/
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author Inbar Yariv
Hamootal Duadi
Dror Fixler
author_facet Inbar Yariv
Hamootal Duadi
Dror Fixler
author_sort Inbar Yariv
collection DOAJ
description Overcoming opaque barriers beyond the penetration depth is based on light-matter interactions, with applications in biomedical optics, material science and security. In wave propagation, scattering is the amount of disorder, mostly treated as a disturbance. Scattered light variations allow overcoming opaque barriers. In order to separate turbid medium layers, absorption-based contrast is commonly used. This paper presents the two-layer study of a noninvasive scattering-based technique. The iterative multi-plane optical property extraction (IMOPE) technique assesses scattering by reconstructing the light phase. The reflection-based IMOPE detects different scattering layers with 0.2 mm<sup>&#x2212;1</sup> sensitivity at different depths, behind layers up to 6 mm thick.
format Article
id doaj-art-608b65ae63c548059014a73718ca8464
institution Kabale University
issn 1943-0655
language English
publishDate 2020-01-01
publisher IEEE
record_format Article
series IEEE Photonics Journal
spelling doaj-art-608b65ae63c548059014a73718ca84642025-08-20T03:33:14ZengIEEEIEEE Photonics Journal1943-06552020-01-0112511310.1109/JPHOT.2020.30176979170757Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance MeasurementsInbar Yariv0Hamootal Duadi1Dror Fixler2https://orcid.org/0000-0003-0963-7908Faculty of Engineering and the Institute of Nanotechnology and Advanced Materials, Bar Ilan University, Ramat Gan, IsraelFaculty of Engineering and the Institute of Nanotechnology and Advanced Materials, Bar Ilan University, Ramat Gan, IsraelFaculty of Engineering and the Institute of Nanotechnology and Advanced Materials, Bar Ilan University, Ramat Gan, IsraelOvercoming opaque barriers beyond the penetration depth is based on light-matter interactions, with applications in biomedical optics, material science and security. In wave propagation, scattering is the amount of disorder, mostly treated as a disturbance. Scattered light variations allow overcoming opaque barriers. In order to separate turbid medium layers, absorption-based contrast is commonly used. This paper presents the two-layer study of a noninvasive scattering-based technique. The iterative multi-plane optical property extraction (IMOPE) technique assesses scattering by reconstructing the light phase. The reflection-based IMOPE detects different scattering layers with 0.2 mm<sup>&#x2212;1</sup> sensitivity at different depths, behind layers up to 6 mm thick.https://ieeexplore.ieee.org/document/9170757/Optical propertiesscatteringGS algorithmturbid mediumdiffusion reflection and multi-layer media
spellingShingle Inbar Yariv
Hamootal Duadi
Dror Fixler
Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements
IEEE Photonics Journal
Optical properties
scattering
GS algorithm
turbid medium
diffusion reflection and multi-layer media
title Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements
title_full Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements
title_fullStr Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements
title_full_unstemmed Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements
title_short Depth Scattering Characterization of Multi-Layer Turbid Media Based on Iterative Multi-Plane Reflectance Measurements
title_sort depth scattering characterization of multi layer turbid media based on iterative multi plane reflectance measurements
topic Optical properties
scattering
GS algorithm
turbid medium
diffusion reflection and multi-layer media
url https://ieeexplore.ieee.org/document/9170757/
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AT hamootalduadi depthscatteringcharacterizationofmultilayerturbidmediabasedoniterativemultiplanereflectancemeasurements
AT drorfixler depthscatteringcharacterizationofmultilayerturbidmediabasedoniterativemultiplanereflectancemeasurements