APA (7th ed.) Citation

Melanie, M., Nicolas, W., Nicole, A., Axel, H., Giso, H., & Fabian, G. Impact of high-temperature processing steps on the long-term stability of charge carrier lifetime in n-type FZ-silicon. EDP Sciences.

Chicago Style (17th ed.) Citation

Melanie, Mehler, Weinert Nicolas, Aßmann Nicole, Herguth Axel, Hahn Giso, and Geml Fabian. Impact of High-temperature Processing Steps on the Long-term Stability of Charge Carrier Lifetime in N-type FZ-silicon. EDP Sciences.

MLA (9th ed.) Citation

Melanie, Mehler, et al. Impact of High-temperature Processing Steps on the Long-term Stability of Charge Carrier Lifetime in N-type FZ-silicon. EDP Sciences.