Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co
Spectral ellipsometry technique is demonstrated to be a useful tool for the investigation of optical and magneto-optical parameters of magnetic heterostructures. Ellipsometry parameters ψ, Δ were measured in the range of 350-1000 nm. Solving the inverse problem by a regression method the refractive...
Saved in:
| Main Authors: | , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
Sumy State University
2013-12-01
|
| Series: | Журнал нано- та електронної фізики |
| Subjects: | |
| Online Access: | http://jnep.sumdu.edu.ua/download/numbers/2013/4/articles/jnep_2013_V5_04002.pdf |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1849412085132296192 |
|---|---|
| author | A.T. Morchenko L.V. Panina V.G. Kostishyn N.A. Yudanov S.P. Kurochka A.A. Sergienko R.D. Piliposyan N.N. Krupa |
| author_facet | A.T. Morchenko L.V. Panina V.G. Kostishyn N.A. Yudanov S.P. Kurochka A.A. Sergienko R.D. Piliposyan N.N. Krupa |
| author_sort | A.T. Morchenko |
| collection | DOAJ |
| description | Spectral ellipsometry technique is demonstrated to be a useful tool for the investigation of optical and magneto-optical parameters of magnetic heterostructures. Ellipsometry parameters ψ, Δ were measured in the range of 350-1000 nm. Solving the inverse problem by a regression method the refractive index and thickness of the layers were deduced. Magneto-optical spectra were detected in the configuration of equatorial Kerr effect which is fully compatible with the ellipsometry measurements. Spectroscopic ellipsometry method of magnetic structure characterisation can be used for in situ monitoring of magnetic film growth in various processes such as magnetron sputtering, electron beam evaporation and ion beam sputtering. |
| format | Article |
| id | doaj-art-5ece972af79a4463be0b67266b2dcbda |
| institution | Kabale University |
| issn | 2077-6772 |
| language | English |
| publishDate | 2013-12-01 |
| publisher | Sumy State University |
| record_format | Article |
| series | Журнал нано- та електронної фізики |
| spelling | doaj-art-5ece972af79a4463be0b67266b2dcbda2025-08-20T03:34:33ZengSumy State UniversityЖурнал нано- та електронної фізики2077-67722013-12-015404002-104002-4Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and CoA.T. Morchenko0 L.V. Panina1V.G. Kostishyn2N.A. Yudanov3S.P. Kurochka4A.A. Sergienko5R.D. Piliposyan6N.N. Krupa7National University of Science and Technology, MISIS, 4, Leninsky Ave., 119049 Moscow, RussiaNational University of Science and Technology, MISIS, 4, Leninsky Ave., 119049 Moscow, RussiaNational University of Science and Technology, MISIS, 4, Leninsky Ave., 119049 Moscow, RussiaNational University of Science and Technology, MISIS, 4, Leninsky Ave., 119049 Moscow, RussiaNational University of Science and Technology, MISIS, 4, Leninsky Ave., 119049 Moscow, RussiaNational University of Science and Technology, MISIS, 4, Leninsky Ave., 119049 Moscow, RussiaNational University of Science and Technology, MISIS, 4, Leninsky Ave., 119049 Moscow, RussiaInstitute of magnetism, NASU, 36b, Vernadsky Str., 03142 Kiev, UkraineSpectral ellipsometry technique is demonstrated to be a useful tool for the investigation of optical and magneto-optical parameters of magnetic heterostructures. Ellipsometry parameters ψ, Δ were measured in the range of 350-1000 nm. Solving the inverse problem by a regression method the refractive index and thickness of the layers were deduced. Magneto-optical spectra were detected in the configuration of equatorial Kerr effect which is fully compatible with the ellipsometry measurements. Spectroscopic ellipsometry method of magnetic structure characterisation can be used for in situ monitoring of magnetic film growth in various processes such as magnetron sputtering, electron beam evaporation and ion beam sputtering.http://jnep.sumdu.edu.ua/download/numbers/2013/4/articles/jnep_2013_V5_04002.pdfMagneto-ellipsometryMagnetic nanofilmsKerr effectIn situ ellipsometry |
| spellingShingle | A.T. Morchenko L.V. Panina V.G. Kostishyn N.A. Yudanov S.P. Kurochka A.A. Sergienko R.D. Piliposyan N.N. Krupa Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co Журнал нано- та електронної фізики Magneto-ellipsometry Magnetic nanofilms Kerr effect In situ ellipsometry |
| title | Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co |
| title_full | Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co |
| title_fullStr | Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co |
| title_full_unstemmed | Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co |
| title_short | Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co |
| title_sort | magneto ellipsometry investigations of multilayer nanofilms of fe and co |
| topic | Magneto-ellipsometry Magnetic nanofilms Kerr effect In situ ellipsometry |
| url | http://jnep.sumdu.edu.ua/download/numbers/2013/4/articles/jnep_2013_V5_04002.pdf |
| work_keys_str_mv | AT atmorchenko magnetoellipsometryinvestigationsofmultilayernanofilmsoffeandco AT lvpanina magnetoellipsometryinvestigationsofmultilayernanofilmsoffeandco AT vgkostishyn magnetoellipsometryinvestigationsofmultilayernanofilmsoffeandco AT nayudanov magnetoellipsometryinvestigationsofmultilayernanofilmsoffeandco AT spkurochka magnetoellipsometryinvestigationsofmultilayernanofilmsoffeandco AT aasergienko magnetoellipsometryinvestigationsofmultilayernanofilmsoffeandco AT rdpiliposyan magnetoellipsometryinvestigationsofmultilayernanofilmsoffeandco AT nnkrupa magnetoellipsometryinvestigationsofmultilayernanofilmsoffeandco |