Piezoelectric Characteristics of LiNbO3 Thin-film Heterostructures via Piezoresponse Force Microscopy

Electro-optic LiNbO3 thin films were deposited on Si(100) and Si(111) substrates using a radio-frequency magnetron sputtering process. The piezoelectric properties of the LiNbO3 films were investigated using the scanning probe microscopy in the piezoresponse mode. The obtained results show the high...

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Main Authors: D.A. Kiselev, S.V. Ksenich, R.N. Zhukov, A.S. Bykov, M.D. Malinkovich, V.V. Shvartsman, D.C. Lupascu, Yu.N. Parkhomenko
Format: Article
Language:English
Published: Sumy State University 2013-12-01
Series:Журнал нано- та електронної фізики
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Online Access:http://jnep.sumdu.edu.ua/download/numbers/2013/4/articles/jnep_2013_V5_04041.pdf
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_version_ 1849700890000228352
author D.A. Kiselev
S.V. Ksenich
R.N. Zhukov
A.S. Bykov
M.D. Malinkovich
V.V. Shvartsman
D.C. Lupascu
Yu.N. Parkhomenko
author_facet D.A. Kiselev
S.V. Ksenich
R.N. Zhukov
A.S. Bykov
M.D. Malinkovich
V.V. Shvartsman
D.C. Lupascu
Yu.N. Parkhomenko
author_sort D.A. Kiselev
collection DOAJ
description Electro-optic LiNbO3 thin films were deposited on Si(100) and Si(111) substrates using a radio-frequency magnetron sputtering process. The piezoelectric properties of the LiNbO3 films were investigated using the scanning probe microscopy in the piezoresponse mode. The obtained results show the high degree of grains orientation in polycrystalline structure. The piezoelectric modulus (dzz) was estimated to be 16 pm/V (for LiNbO3 / Si(100)) and 22 pm/V (for LiNbO3 / Si(111)) and the polarization about of 0.37 C·m – 2. These values are larger than those reported previously for LiNbO3 films.
format Article
id doaj-art-5e4974052c1948dbb44be8e49664aef2
institution DOAJ
issn 2077-6772
language English
publishDate 2013-12-01
publisher Sumy State University
record_format Article
series Журнал нано- та електронної фізики
spelling doaj-art-5e4974052c1948dbb44be8e49664aef22025-08-20T03:18:08ZengSumy State UniversityЖурнал нано- та електронної фізики2077-67722013-12-015404041-104041-3Piezoelectric Characteristics of LiNbO3 Thin-film Heterostructures via Piezoresponse Force MicroscopyD.A. Kiselev0S.V. Ksenich1R.N. Zhukov2A.S. Bykov3M.D. Malinkovich4 V.V. Shvartsman5D.C. Lupascu6Yu.N. Parkhomenko7National University of Science and Technology "MISiS", 4, Leninskiy Pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy Pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy Pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy Pr., 119049 Moscow, Russian FederationNational University of Science and Technology "MISiS", 4, Leninskiy Pr., 119049 Moscow, Russian FederationInstitut für Materialwissenschaft, and Center for Nanointegration Duisburg-Essen (CENIDE), Universität Duisburg-Essen, 15, Universitätsstr., 45141 Essen, GermanyInstitut für Materialwissenschaft, and Center for Nanointegration Duisburg-Essen (CENIDE), Universität Duisburg-Essen, 15, Universitätsstr., 45141 Essen, GermanyNational University of Science and Technology "MISiS", 4, Leninskiy Pr., 119049 Moscow, Russian FederationElectro-optic LiNbO3 thin films were deposited on Si(100) and Si(111) substrates using a radio-frequency magnetron sputtering process. The piezoelectric properties of the LiNbO3 films were investigated using the scanning probe microscopy in the piezoresponse mode. The obtained results show the high degree of grains orientation in polycrystalline structure. The piezoelectric modulus (dzz) was estimated to be 16 pm/V (for LiNbO3 / Si(100)) and 22 pm/V (for LiNbO3 / Si(111)) and the polarization about of 0.37 C·m – 2. These values are larger than those reported previously for LiNbO3 films.http://jnep.sumdu.edu.ua/download/numbers/2013/4/articles/jnep_2013_V5_04041.pdfLiNbO3 thin filmPiezoresponse force microscopyDomain structure
spellingShingle D.A. Kiselev
S.V. Ksenich
R.N. Zhukov
A.S. Bykov
M.D. Malinkovich
V.V. Shvartsman
D.C. Lupascu
Yu.N. Parkhomenko
Piezoelectric Characteristics of LiNbO3 Thin-film Heterostructures via Piezoresponse Force Microscopy
Журнал нано- та електронної фізики
LiNbO3 thin film
Piezoresponse force microscopy
Domain structure
title Piezoelectric Characteristics of LiNbO3 Thin-film Heterostructures via Piezoresponse Force Microscopy
title_full Piezoelectric Characteristics of LiNbO3 Thin-film Heterostructures via Piezoresponse Force Microscopy
title_fullStr Piezoelectric Characteristics of LiNbO3 Thin-film Heterostructures via Piezoresponse Force Microscopy
title_full_unstemmed Piezoelectric Characteristics of LiNbO3 Thin-film Heterostructures via Piezoresponse Force Microscopy
title_short Piezoelectric Characteristics of LiNbO3 Thin-film Heterostructures via Piezoresponse Force Microscopy
title_sort piezoelectric characteristics of linbo3 thin film heterostructures via piezoresponse force microscopy
topic LiNbO3 thin film
Piezoresponse force microscopy
Domain structure
url http://jnep.sumdu.edu.ua/download/numbers/2013/4/articles/jnep_2013_V5_04041.pdf
work_keys_str_mv AT dakiselev piezoelectriccharacteristicsoflinbo3thinfilmheterostructuresviapiezoresponseforcemicroscopy
AT svksenich piezoelectriccharacteristicsoflinbo3thinfilmheterostructuresviapiezoresponseforcemicroscopy
AT rnzhukov piezoelectriccharacteristicsoflinbo3thinfilmheterostructuresviapiezoresponseforcemicroscopy
AT asbykov piezoelectriccharacteristicsoflinbo3thinfilmheterostructuresviapiezoresponseforcemicroscopy
AT mdmalinkovich piezoelectriccharacteristicsoflinbo3thinfilmheterostructuresviapiezoresponseforcemicroscopy
AT vvshvartsman piezoelectriccharacteristicsoflinbo3thinfilmheterostructuresviapiezoresponseforcemicroscopy
AT dclupascu piezoelectriccharacteristicsoflinbo3thinfilmheterostructuresviapiezoresponseforcemicroscopy
AT yunparkhomenko piezoelectriccharacteristicsoflinbo3thinfilmheterostructuresviapiezoresponseforcemicroscopy