Substrate Effect on the Optical Reflectance and Transmittance of Thin-Film Structures

A rigorous and consistent approach is demonstrated to develop a model of the 4M structure (the four-media structure of a film on a substrate of finite thickness). The general equations obtained for the reflectance and transmittance spectra of the 4M structure are simplified by employing a procedure...

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Main Authors: Anatoly Barybin, Victor Shapovalov
Format: Article
Language:English
Published: Wiley 2010-01-01
Series:International Journal of Optics
Online Access:http://dx.doi.org/10.1155/2010/137572
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author Anatoly Barybin
Victor Shapovalov
author_facet Anatoly Barybin
Victor Shapovalov
author_sort Anatoly Barybin
collection DOAJ
description A rigorous and consistent approach is demonstrated to develop a model of the 4M structure (the four-media structure of a film on a substrate of finite thickness). The general equations obtained for the reflectance and transmittance spectra of the 4M structure are simplified by employing a procedure of the so-called device averaging to reduce them to a succinct form convenient for processing of experimental spectra for the structures with a thick substrate. The newly derived equations are applied to two special cases: (i) an arbitrary film on highly absorbing substrates and (ii) a slightly absorbing film on transparent substrates. The reflectance and transmittance spectra represented in the simplified (with the device averaging) form have a practical application for determining the film thickness and optical constants from experimental spectra by using the known techniques.
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institution Kabale University
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language English
publishDate 2010-01-01
publisher Wiley
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series International Journal of Optics
spelling doaj-art-5c999b54fab3443ba008655e1b3fdc1b2025-02-03T06:05:58ZengWileyInternational Journal of Optics1687-93841687-93922010-01-01201010.1155/2010/137572137572Substrate Effect on the Optical Reflectance and Transmittance of Thin-Film StructuresAnatoly Barybin0Victor Shapovalov1Electronics Department, Saint Petersburg State Electrotechnical University, Saint Petersburg 197376, RussiaElectronics Department, Saint Petersburg State Electrotechnical University, Saint Petersburg 197376, RussiaA rigorous and consistent approach is demonstrated to develop a model of the 4M structure (the four-media structure of a film on a substrate of finite thickness). The general equations obtained for the reflectance and transmittance spectra of the 4M structure are simplified by employing a procedure of the so-called device averaging to reduce them to a succinct form convenient for processing of experimental spectra for the structures with a thick substrate. The newly derived equations are applied to two special cases: (i) an arbitrary film on highly absorbing substrates and (ii) a slightly absorbing film on transparent substrates. The reflectance and transmittance spectra represented in the simplified (with the device averaging) form have a practical application for determining the film thickness and optical constants from experimental spectra by using the known techniques.http://dx.doi.org/10.1155/2010/137572
spellingShingle Anatoly Barybin
Victor Shapovalov
Substrate Effect on the Optical Reflectance and Transmittance of Thin-Film Structures
International Journal of Optics
title Substrate Effect on the Optical Reflectance and Transmittance of Thin-Film Structures
title_full Substrate Effect on the Optical Reflectance and Transmittance of Thin-Film Structures
title_fullStr Substrate Effect on the Optical Reflectance and Transmittance of Thin-Film Structures
title_full_unstemmed Substrate Effect on the Optical Reflectance and Transmittance of Thin-Film Structures
title_short Substrate Effect on the Optical Reflectance and Transmittance of Thin-Film Structures
title_sort substrate effect on the optical reflectance and transmittance of thin film structures
url http://dx.doi.org/10.1155/2010/137572
work_keys_str_mv AT anatolybarybin substrateeffectontheopticalreflectanceandtransmittanceofthinfilmstructures
AT victorshapovalov substrateeffectontheopticalreflectanceandtransmittanceofthinfilmstructures