A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions
This article presents a novel method for accurate online extraction of semiconductor ON-state resistance in the presence of measurement noise. In this method, the ON-state resistance value is extracted from the measured ON-state voltage of the semiconductors and the measured load current. The extrac...
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| Format: | Article |
| Language: | English |
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IEEE
2024-01-01
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| Series: | IEEE Open Journal of Instrumentation and Measurement |
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| Online Access: | https://ieeexplore.ieee.org/document/10479961/ |
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| author | Mohsen Asoodar Mehrdad Nahalparvari Simon Schneider Iman Shafikhani Gunnar Ingestrom Hans-Peter Nee |
| author_facet | Mohsen Asoodar Mehrdad Nahalparvari Simon Schneider Iman Shafikhani Gunnar Ingestrom Hans-Peter Nee |
| author_sort | Mohsen Asoodar |
| collection | DOAJ |
| description | This article presents a novel method for accurate online extraction of semiconductor ON-state resistance in the presence of measurement noise. In this method, the ON-state resistance value is extracted from the measured ON-state voltage of the semiconductors and the measured load current. The extracted ON-state resistance can be used for online condition monitoring of semiconductors. The proposed method is based on the extraction of selective harmonic content. The estimated values are further enhanced through an integral action that increases the signal-to-noise ratio, making the proposed method suitable in the presence of noisy measurements. The efficacy of the proposed method is verified through simulations in the MATLAB/Simulink environment, and experimentally. The estimated ON-state resistance values from the online setup are compared to offline measurements from an industrial curve tracer, where an overall estimation error of less than 1% is observed. The proposed solution maintains its estimation accuracy under variable load conditions and for different temperatures of the device under test. |
| format | Article |
| id | doaj-art-5c3a02e8b2d6494b83ce11fabbb87b39 |
| institution | Kabale University |
| issn | 2768-7236 |
| language | English |
| publishDate | 2024-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Open Journal of Instrumentation and Measurement |
| spelling | doaj-art-5c3a02e8b2d6494b83ce11fabbb87b392025-01-15T00:04:27ZengIEEEIEEE Open Journal of Instrumentation and Measurement2768-72362024-01-01311310.1109/OJIM.2024.337941410479961A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy ConditionsMohsen Asoodar0https://orcid.org/0000-0001-5919-2308Mehrdad Nahalparvari1https://orcid.org/0000-0002-1136-581XSimon Schneider2https://orcid.org/0000-0002-8902-7263Iman Shafikhani3https://orcid.org/0000-0002-8047-8703Gunnar Ingestrom4https://orcid.org/0009-0000-1964-2458Hans-Peter Nee5https://orcid.org/0000-0002-1755-1365Department of Electrical Engineering, KTH Royal Institute of Technology, Stockholm, SwedenDepartment of Electrical Engineering, KTH Royal Institute of Technology, Stockholm, SwedenDepartment of Electrical Engineering, KTH Royal Institute of Technology, Stockholm, SwedenDepartment of Electrical Engineering, Linköping University, Linköping, SwedenGrid and Power Quality Solutions, Hitachi Energy Sweden AB, Västerås, SwedenDepartment of Electrical Engineering, KTH Royal Institute of Technology, Stockholm, SwedenThis article presents a novel method for accurate online extraction of semiconductor ON-state resistance in the presence of measurement noise. In this method, the ON-state resistance value is extracted from the measured ON-state voltage of the semiconductors and the measured load current. The extracted ON-state resistance can be used for online condition monitoring of semiconductors. The proposed method is based on the extraction of selective harmonic content. The estimated values are further enhanced through an integral action that increases the signal-to-noise ratio, making the proposed method suitable in the presence of noisy measurements. The efficacy of the proposed method is verified through simulations in the MATLAB/Simulink environment, and experimentally. The estimated ON-state resistance values from the online setup are compared to offline measurements from an industrial curve tracer, where an overall estimation error of less than 1% is observed. The proposed solution maintains its estimation accuracy under variable load conditions and for different temperatures of the device under test.https://ieeexplore.ieee.org/document/10479961/Condition monitoringhealth monitoringonline estimationON-state resistancereliabilitysemiconductor devices |
| spellingShingle | Mohsen Asoodar Mehrdad Nahalparvari Simon Schneider Iman Shafikhani Gunnar Ingestrom Hans-Peter Nee A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions IEEE Open Journal of Instrumentation and Measurement Condition monitoring health monitoring online estimation ON-state resistance reliability semiconductor devices |
| title | A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions |
| title_full | A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions |
| title_fullStr | A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions |
| title_full_unstemmed | A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions |
| title_short | A Novel ON-State Resistance Estimation Technique for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions |
| title_sort | novel on state resistance estimation technique for online condition monitoring of semiconductor devices under noisy conditions |
| topic | Condition monitoring health monitoring online estimation ON-state resistance reliability semiconductor devices |
| url | https://ieeexplore.ieee.org/document/10479961/ |
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