Experimental Determination of Effective Minority Carrier Lifetime in HgCdTe Photovoltaic Detectors Using Optical and Electrical Methods
This paper presents experiment measurements of minority carrier lifetime using three different methods including modified open-circuit voltage decay (PIOCVD) method, small parallel resistance (SPR) method, and pulse recovery technique (PRT) on pn junction photodiode of the HgCdTe photodetector array...
Saved in:
Main Authors: | Haoyang Cui, Jialin Wang, Chaoqun Wang, Can Liu, Kaiyun Pi, Xiang Li, Yongpeng Xu, Zhong Tang |
---|---|
Format: | Article |
Language: | English |
Published: |
Wiley
2015-01-01
|
Series: | Advances in Condensed Matter Physics |
Online Access: | http://dx.doi.org/10.1155/2015/482738 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
The Effect of Metal-Semiconductor Contact on the Transient Photovoltaic Characteristic of HgCdTe PV Detector
by: Haoyang Cui, et al.
Published: (2013-01-01) -
New Coefficients of the Minority Carrier Lifetime and Bandgap Narrowing Models in the Transparent Emitter of Thin Film Silicon Solar Cells
by: M. Benosman, et al.
Published: (2001-01-01) -
New Coefficients of the Minority Carrier Lifetime and Bandgap Narrowing Models in the Transparent Emitter of Thin Film Silicon Solar Cells
by: A. Zerga, et al.
Published: (2003-01-01) -
Simulation of Open Circuit Voltage Decay for Solar Cell Determination of the Base Minority Carrier Lifetime and the Back Surface Recombination Velocity
by: B. Affour, et al.
Published: (1997-01-01) -
Correlation of Interfacial Transportation Properties of CdS/CdTe Heterojunction and Performance of CdTe Polycrystalline Thin-Film Solar Cells
by: Guanggen Zeng, et al.
Published: (2015-01-01)