Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements
Ferroelectric thin films integrated on passive photonic platforms offer ways to achieve functionalities that are otherwise impossible or inefficient, such as electro-optic (EO) modulation, acousto-optic modulation or optical nonlinear conversion. Characterization methods of the EO properties of thin...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2025-01-01
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| Series: | JPhys Photonics |
| Subjects: | |
| Online Access: | https://doi.org/10.1088/2515-7647/ada902 |
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