Geest, K. D., Lievens, E., Picavet, E., Buysser, K. D., Thourhout, D. V., & Beeckman, J. Extraction of individual Pockels coefficients of thin films via interferometric reflection measurements. IOP Publishing.
Chicago Style (17th ed.) CitationGeest, Kobe De, Enes Lievens, Ewout Picavet, Klaartje De Buysser, Dries Van Thourhout, and Jeroen Beeckman. Extraction of Individual Pockels Coefficients of Thin Films via Interferometric Reflection Measurements. IOP Publishing.
MLA (9th ed.) CitationGeest, Kobe De, et al. Extraction of Individual Pockels Coefficients of Thin Films via Interferometric Reflection Measurements. IOP Publishing.
Warning: These citations may not always be 100% accurate.