Experimental Verification of Degenerate Band Edge Dispersion in Silicon Photonic Integrated Circuits
On resonance, periodic dielectric media of finite length exhibit large and distributed internal electric field distributions. The large and distributed fields have been exploited for applications in light emission, optical switching, and nonlinear optics. Resonance quality factors scale as the numbe...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2016-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/7763851/ |
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