Experimental Verification of Degenerate Band Edge Dispersion in Silicon Photonic Integrated Circuits

On resonance, periodic dielectric media of finite length exhibit large and distributed internal electric field distributions. The large and distributed fields have been exploited for applications in light emission, optical switching, and nonlinear optics. Resonance quality factors scale as the numbe...

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Bibliographic Details
Main Authors: Justin R. Burr, Michael G. Wood, Ronald M. Reano
Format: Article
Language:English
Published: IEEE 2016-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/7763851/
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