Experimental Verification of Degenerate Band Edge Dispersion in Silicon Photonic Integrated Circuits
On resonance, periodic dielectric media of finite length exhibit large and distributed internal electric field distributions. The large and distributed fields have been exploited for applications in light emission, optical switching, and nonlinear optics. Resonance quality factors scale as the numbe...
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2016-01-01
|
| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/7763851/ |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1850109614818852864 |
|---|---|
| author | Justin R. Burr Michael G. Wood Ronald M. Reano |
| author_facet | Justin R. Burr Michael G. Wood Ronald M. Reano |
| author_sort | Justin R. Burr |
| collection | DOAJ |
| description | On resonance, periodic dielectric media of finite length exhibit large and distributed internal electric field distributions. The large and distributed fields have been exploited for applications in light emission, optical switching, and nonlinear optics. Resonance quality factors scale as the number of periods cubed near a regular band edge with quadratic dispersion. For chip-scale integrated photonics, significant footprint reduction is possible by exploiting the quartic dispersion of a degenerate band edge with quality factors that scale to the fifth power of the number of periods. Band diagrams with quartic dispersion are extracted from transmission measurements of fabricated devices realized in silicon photonics. Transmission measurements show Fano resonances with a sharp transmission peak-to-bandgap extinction ratio of 20 dB and quality factors of 27 000. |
| format | Article |
| id | doaj-art-5b48e8077f134292a87df2048d652d96 |
| institution | OA Journals |
| issn | 1943-0655 |
| language | English |
| publishDate | 2016-01-01 |
| publisher | IEEE |
| record_format | Article |
| series | IEEE Photonics Journal |
| spelling | doaj-art-5b48e8077f134292a87df2048d652d962025-08-20T02:38:02ZengIEEEIEEE Photonics Journal1943-06552016-01-018611010.1109/JPHOT.2016.26332257763851Experimental Verification of Degenerate Band Edge Dispersion in Silicon Photonic Integrated CircuitsJustin R. Burr0Michael G. Wood1Ronald M. Reano2Electroscience Laboratory, Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USAElectroscience Laboratory, Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USAElectroscience Laboratory, Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH, USAOn resonance, periodic dielectric media of finite length exhibit large and distributed internal electric field distributions. The large and distributed fields have been exploited for applications in light emission, optical switching, and nonlinear optics. Resonance quality factors scale as the number of periods cubed near a regular band edge with quadratic dispersion. For chip-scale integrated photonics, significant footprint reduction is possible by exploiting the quartic dispersion of a degenerate band edge with quality factors that scale to the fifth power of the number of periods. Band diagrams with quartic dispersion are extracted from transmission measurements of fabricated devices realized in silicon photonics. Transmission measurements show Fano resonances with a sharp transmission peak-to-bandgap extinction ratio of 20 dB and quality factors of 27 000.https://ieeexplore.ieee.org/document/7763851/Integrated optics devicesphotonic crystalswaveguides |
| spellingShingle | Justin R. Burr Michael G. Wood Ronald M. Reano Experimental Verification of Degenerate Band Edge Dispersion in Silicon Photonic Integrated Circuits IEEE Photonics Journal Integrated optics devices photonic crystals waveguides |
| title | Experimental Verification of Degenerate Band Edge Dispersion in Silicon Photonic Integrated Circuits |
| title_full | Experimental Verification of Degenerate Band Edge Dispersion in Silicon Photonic Integrated Circuits |
| title_fullStr | Experimental Verification of Degenerate Band Edge Dispersion in Silicon Photonic Integrated Circuits |
| title_full_unstemmed | Experimental Verification of Degenerate Band Edge Dispersion in Silicon Photonic Integrated Circuits |
| title_short | Experimental Verification of Degenerate Band Edge Dispersion in Silicon Photonic Integrated Circuits |
| title_sort | experimental verification of degenerate band edge dispersion in silicon photonic integrated circuits |
| topic | Integrated optics devices photonic crystals waveguides |
| url | https://ieeexplore.ieee.org/document/7763851/ |
| work_keys_str_mv | AT justinrburr experimentalverificationofdegeneratebandedgedispersioninsiliconphotonicintegratedcircuits AT michaelgwood experimentalverificationofdegeneratebandedgedispersioninsiliconphotonicintegratedcircuits AT ronaldmreano experimentalverificationofdegeneratebandedgedispersioninsiliconphotonicintegratedcircuits |