Scattering Parameter Characterization of a Novel Four-Port Fixture Using Time Domain Gating and Mason’s Gain Formula
Modern electronic devices comprise a complex structure of interconnected components, and signals passing through various fixtures are prone to attenuation and distortion across various frequencies. This paper presents a novel four-port fixture characterization scheme that converts the S-parameters o...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2025-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/11087201/ |
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