Analysis of Corn Deterioration Due to Molding Using Surface-Enhanced Raman Spectroscopy

Analysis of Corn Deterioration Due to Molding Using Surface-Enhanced Raman Spectroscopy

Efficient and rapid identification of corn mildew levels is essential for proper storage and transportation. This study utilized surface-enhanced Raman spectroscopy (SERS) to obtain Raman spectral fingerprints of moldy corn, combined with multi-class support vector machines (SVM) for rapid detection...

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Bibliographic Details
Main Authors: Xiaoyan Wei, Guifang Wu, Pengcheng Qiu, Huihe Yang, Shubin Yan, Jianing Di, Xiangpeng Zhao, Feixu Zhang, Hongda Zhang
Format: Article
Language:English
Published: North Carolina State University 2025-01-01
Series:BioResources
Subjects:
moldy corn
raman spectroscopy
principal component analysis (pca)
partial least squares regression (pls-regression)
support vector machine (svm)
Online Access:https://ojs.bioresources.com/index.php/BRJ/article/view/24125
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