Measurements of the quantum yield of silicon using Geiger-mode avalanching photodetectors
Abstract Accurate characterization of quantum yield is crucial to the reconstruction of energy depositions in silicon at the eV scale. This work presents a new method for experimentally calculating quantum yield using vacuum UV-sensitive silicon photomultipliers (SiPMs), which can be used to determi...
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| Main Authors: | , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2025-02-01
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| Series: | European Physical Journal C: Particles and Fields |
| Online Access: | https://doi.org/10.1140/epjc/s10052-025-13883-x |
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