An X-Ray Technique for Evaluating the Structure of Films for Device Applications
Saved in:
Main Authors: | Ian N. Court, R. N. Clarke |
---|---|
Format: | Article |
Language: | English |
Published: |
Wiley
1978-01-01
|
Series: | Active and Passive Electronic Components |
Online Access: | http://dx.doi.org/10.1155/APEC.5.107 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
PROSPECTS FOR APPLICATION OF SCANNING DIGITAL X-RAY APPARATUS IN TRAUMATOLOGY
by: A. N. Chepelev, et al.
Published: (2013-10-01) -
Evaluation of 3D seed structure and cellular traits in-situ using X-ray microscopy
by: Marcus Griffiths, et al.
Published: (2025-02-01) -
Advancements in operando X-ray techniques for metal additive manufacturing
by: Kaushalendra K. Singh, et al.
Published: (2024-11-01) -
Clustering of X-Ray-Selected AGN
by: N. Cappelluti, et al.
Published: (2012-01-01) -
Pore structure characterization of porous building material by X-ray computed tomography (XCT) and X-ray microscopy (XRM)
by: Chengnan Shi, et al.
Published: (2025-02-01)