An X-Ray Technique for Evaluating the Structure of Films for Device Applications

An X-Ray Technique for Evaluating the Structure of Films for Device Applications

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Bibliographic Details
Main Authors:	Ian N. Court, R. N. Clarke
Format:	Article
Language:	English
Published:	Wiley 1978-01-01
Series:	Active and Passive Electronic Components
Online Access:	http://dx.doi.org/10.1155/APEC.5.107
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