Defect modeling in semiconductors: the role of first principles simulations and machine learning
Point defects in semiconductors dictate their electronic and optical properties. Vacancies, interstitials, substitutional defects, and defect complexes can form in the semiconductor lattice and significantly impact its performance in applications such as solar absorption, light emission, electronics...
Saved in:
Main Authors: | Md Habibur Rahman, Arun Mannodi-Kanakkithodi |
---|---|
Format: | Article |
Language: | English |
Published: |
IOP Publishing
2025-01-01
|
Series: | JPhys Materials |
Subjects: | |
Online Access: | https://doi.org/10.1088/2515-7639/adb181 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Similar Items
-
A Novel Approach to Test-Induced Defect Detection in Semiconductor Wafers, Using Graph-Based Semi-Supervised Learning (GSSL)
by: Pedram Aridas, et al.
Published: (2025-01-01) -
STUDY OF SILICON-INSULATOR STRUCTURE DEFECTS BASED ON ANALYSIS OF A SPATIAL DISTRIBUTION OF A SEMICONDUCTOR WAFERS’ SURFACE POTENTIAL
by: R. I. Vorobey, et al.
Published: (2015-03-01) -
ESTIMATION OF TOPOGRAPHIC DEFECTS DIMENSIONS OF SEMICONDUCTOR SILICON STRUCTURES
by: S. F. Sianko, et al.
Published: (2018-03-01) -
WELCOMING THE SEMICONDUCTOR INDUSTRY IN GHANA: CHALLENGES AND RECOMMENDATIONS – A CASE STUDY
by: GIDEON ADOM-BAMFI, et al.
Published: (2021-01-01) -
Low-Frequency Admittance of Capacitor with Working Substance “Insulator–Partially Disordered Semiconductor– Insulator”
by: N. A. Poklonski, et al.
Published: (2021-10-01)