Characterizing ultrashort pulses with photon energies above 1.12 eV based on transient absorption in silicon thin films

Characterizing ultrashort pulses with photon energies above 1.12 eV based on transient absorption in silicon thin films

Frequency-resolved optical switching (FROSt) is a phase-matching-free characterization technique for ultrashort pulses based on transient absorption in semiconductors. So far, this technique has been limited to characterizing pulses with photon energies smaller than the bandgap of the semiconductors...

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Bibliographic Details
Main Authors: Mayank Kumar, Saadat Mokhtari, Tristan Guay, Adrien Leblanc, Kosta Oubrerie, Sohail A Jalil, Elissa Haddad, Gaëtan Jargot, Philippe Lassonde, Heide Ibrahim, Giulio Vampa, François Légaré
Format: Article
Language:English
Published: IOP Publishing 2024-01-01
Series:JPhys Photonics
Subjects:
pulse characterization
silicon
frequency-resolved optical switching
transient absorption
Online Access:https://doi.org/10.1088/2515-7647/ad9cdb
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