Elaboration and Characterization of n-Type Organic Semiconductor (Fullerene C<sub>60</sub>) Deposed by Ultrasonic Technique for Sustainable OTFT Fabrication
This study focuses on the deposition of fullerene (C<sub>60</sub>) as thin film on glass substrate by ultrasonic chemical bath deposition (UCBD) processing, under ambient temperature. Highly effective results were obtained from the films based on the solution of C<sub>60</sub>...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-02-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/15/5/2402 |
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| Summary: | This study focuses on the deposition of fullerene (C<sub>60</sub>) as thin film on glass substrate by ultrasonic chemical bath deposition (UCBD) processing, under ambient temperature. Highly effective results were obtained from the films based on the solution of C<sub>60</sub> dissolved in toluene mixed with 2-methoxyethanol. The obtained films were characterized by X-ray diffraction (XRD), infrared spectroscopy (IR), scanning electron microscopy (SEM), and energy dispersive X-ray spectroscopy (EDS). The XRD examination of the thin films reveals the presence of the C<sub>60</sub> cubic phase compared to the powder reference. The molecular structure obtained by Rietveld refinement shows no bonding between the molecules in C<sub>60</sub> powder, while in the deposed thin film the bonding is established. The molecules are bonded between them by pentagons of the right and left molecule. Each four neighbor molecules bond between them and they are all able to geometrically tie to the neighboring molecules under a crystalline FCC structure. The Sherrer and W-H methods were used to investigate microstructural parameters. The lattice parameter and the crystallite size show the same variation tendency. The average lattice parameter for the powder and the deposed films C<sub>60</sub>-3h, C<sub>60</sub>-5h, and C<sub>60</sub>-8h is 14.0652, 14.1901, 14.0529, and 14.1848 Å, respectively, and the crystallite size calculated by the Sherrer method is 37.51, 38.98, 34.35, and 41.54 nm, respectively, as well. The IR spectrum indicated the presence of chemical π bonds (c=c) that are very suitable for enhancing the electronic properties of the material, and SEM analysis illustrated a dense, homogeneous without pinhole structures in the film morphology. Moreover, EDS emphasizes the presence of high carbon concentration and fewer stranger atoms. As a result, despite the UCBD technique being old and not very often applied in the field of organic materials, it is still a cost effective and good alternative method for organic thin film deposition. |
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| ISSN: | 2076-3417 |