Probing millicharged particles at an electron beam dump with ultralow-threshold sensors
Abstract We propose to search for millicharged particles produced in high-intensity electron beam dumps using small ultralow-threshold sensors. As a concrete example, we consider a Skipper-CCD placed behind the beam dump in Hall A at Jefferson Lab. We compute the millicharged particle flux, includin...
Saved in:
| Main Authors: | , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
SpringerOpen
2025-04-01
|
| Series: | Journal of High Energy Physics |
| Subjects: | |
| Online Access: | https://doi.org/10.1007/JHEP04(2025)057 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1850191030188507136 |
|---|---|
| author | Rouven Essig Peiran Li Zhen Liu Megan McDuffie Ryan Plestid Hailin Xu |
| author_facet | Rouven Essig Peiran Li Zhen Liu Megan McDuffie Ryan Plestid Hailin Xu |
| author_sort | Rouven Essig |
| collection | DOAJ |
| description | Abstract We propose to search for millicharged particles produced in high-intensity electron beam dumps using small ultralow-threshold sensors. As a concrete example, we consider a Skipper-CCD placed behind the beam dump in Hall A at Jefferson Lab. We compute the millicharged particle flux, including both electromagnetic cascade and meson productions emanating from an aluminum target. We find that the sensitivity of a modest 2 × 14 array of Skipper-CCDs can exceed the sensitivity of all existing searches for millicharged particle masses below 1.5 GeV, and is either competitive or world leading when compared to other proposed experiments. Our results demonstrate that small-scale ultralow threshold silicon devices can enhance the reach of accelerator-based experiments, while fitting comfortably within existing experimental halls. |
| format | Article |
| id | doaj-art-55f46eec75f64d7c8db88c0e7121572e |
| institution | OA Journals |
| issn | 1029-8479 |
| language | English |
| publishDate | 2025-04-01 |
| publisher | SpringerOpen |
| record_format | Article |
| series | Journal of High Energy Physics |
| spelling | doaj-art-55f46eec75f64d7c8db88c0e7121572e2025-08-20T02:15:01ZengSpringerOpenJournal of High Energy Physics1029-84792025-04-012025413010.1007/JHEP04(2025)057Probing millicharged particles at an electron beam dump with ultralow-threshold sensorsRouven Essig0Peiran Li1Zhen Liu2Megan McDuffie3Ryan Plestid4Hailin Xu5C.N. Yang Institute for Theoretical Physics, Stony Brook UniversitySchool of Physics and Astronomy, University of MinnesotaSchool of Physics and Astronomy, University of MinnesotaC.N. Yang Institute for Theoretical Physics, Stony Brook UniversityWalter Burke Institute for Theoretical Physics, California Institute of TechnologyC.N. Yang Institute for Theoretical Physics, Stony Brook UniversityAbstract We propose to search for millicharged particles produced in high-intensity electron beam dumps using small ultralow-threshold sensors. As a concrete example, we consider a Skipper-CCD placed behind the beam dump in Hall A at Jefferson Lab. We compute the millicharged particle flux, including both electromagnetic cascade and meson productions emanating from an aluminum target. We find that the sensitivity of a modest 2 × 14 array of Skipper-CCDs can exceed the sensitivity of all existing searches for millicharged particle masses below 1.5 GeV, and is either competitive or world leading when compared to other proposed experiments. Our results demonstrate that small-scale ultralow threshold silicon devices can enhance the reach of accelerator-based experiments, while fitting comfortably within existing experimental halls.https://doi.org/10.1007/JHEP04(2025)057Dark Matter at CollidersNew Light ParticlesSpecific BSM Phenomenology |
| spellingShingle | Rouven Essig Peiran Li Zhen Liu Megan McDuffie Ryan Plestid Hailin Xu Probing millicharged particles at an electron beam dump with ultralow-threshold sensors Journal of High Energy Physics Dark Matter at Colliders New Light Particles Specific BSM Phenomenology |
| title | Probing millicharged particles at an electron beam dump with ultralow-threshold sensors |
| title_full | Probing millicharged particles at an electron beam dump with ultralow-threshold sensors |
| title_fullStr | Probing millicharged particles at an electron beam dump with ultralow-threshold sensors |
| title_full_unstemmed | Probing millicharged particles at an electron beam dump with ultralow-threshold sensors |
| title_short | Probing millicharged particles at an electron beam dump with ultralow-threshold sensors |
| title_sort | probing millicharged particles at an electron beam dump with ultralow threshold sensors |
| topic | Dark Matter at Colliders New Light Particles Specific BSM Phenomenology |
| url | https://doi.org/10.1007/JHEP04(2025)057 |
| work_keys_str_mv | AT rouvenessig probingmillichargedparticlesatanelectronbeamdumpwithultralowthresholdsensors AT peiranli probingmillichargedparticlesatanelectronbeamdumpwithultralowthresholdsensors AT zhenliu probingmillichargedparticlesatanelectronbeamdumpwithultralowthresholdsensors AT meganmcduffie probingmillichargedparticlesatanelectronbeamdumpwithultralowthresholdsensors AT ryanplestid probingmillichargedparticlesatanelectronbeamdumpwithultralowthresholdsensors AT hailinxu probingmillichargedparticlesatanelectronbeamdumpwithultralowthresholdsensors |