Applying Genetic Algorithm for test pattern generation process optimization
Objective. Comprehensive integrated circuit (IC) verification plays a crucial role in preventing costly errors and delays in product development cycle. It includes testing interaction and compatibility of different system elements, such as central processing unit, memory and various peripheral devic...
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| Format: | Article |
| Language: | Russian |
| Published: |
Dagestan State Technical University
2024-04-01
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| Series: | Вестник Дагестанского государственного технического университета: Технические науки |
| Subjects: | |
| Online Access: | https://vestnik.dgtu.ru/jour/article/view/1461 |
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