APA (7th ed.) Citation

Ingle, R., Shahade, A. K., Gaikwad, M., & Patil, S. Deep learning driven silicon wafer defect segmentation and classification. Elsevier.

Chicago Style (17th ed.) Citation

Ingle, Rohan, Aniket K. Shahade, Mayur Gaikwad, and Shruti Patil. Deep Learning Driven Silicon Wafer Defect Segmentation and Classification. Elsevier.

MLA (9th ed.) Citation

Ingle, Rohan, et al. Deep Learning Driven Silicon Wafer Defect Segmentation and Classification. Elsevier.