Ambient Moisture‐Induced Self Alignment of Polarization in Ferroelectric Hafnia

Abstract The discovery of nanoscale ferroelectricity in hafnia (HfO2) has paved the way for next generation high‐density, non‐volatile devices. Although the surface conditions of nanoscale HfO2 present one of the fundamental mechanism origins, the impact of external environment on HfO2 ferroelectric...

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Main Authors: Lu‐Qi Wei, Zhao Guan, Wen‐Yi Tong, Wen‐Cheng Fan, Abliz Mattursun, Bin‐Bin Chen, Ping‐Hua Xiang, Genquan Han, Chun‐Gang Duan, Ni Zhong
Format: Article
Language:English
Published: Wiley 2024-12-01
Series:Advanced Science
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Online Access:https://doi.org/10.1002/advs.202410354
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author Lu‐Qi Wei
Zhao Guan
Wen‐Yi Tong
Wen‐Cheng Fan
Abliz Mattursun
Bin‐Bin Chen
Ping‐Hua Xiang
Genquan Han
Chun‐Gang Duan
Ni Zhong
author_facet Lu‐Qi Wei
Zhao Guan
Wen‐Yi Tong
Wen‐Cheng Fan
Abliz Mattursun
Bin‐Bin Chen
Ping‐Hua Xiang
Genquan Han
Chun‐Gang Duan
Ni Zhong
author_sort Lu‐Qi Wei
collection DOAJ
description Abstract The discovery of nanoscale ferroelectricity in hafnia (HfO2) has paved the way for next generation high‐density, non‐volatile devices. Although the surface conditions of nanoscale HfO2 present one of the fundamental mechanism origins, the impact of external environment on HfO2 ferroelectricity remains unknown. In this study, the deleterious effect of ambient moisture is examined on the stability of ferroelectricity using Hf0.5Zr0.5O2 (HZO) films as a model system. It is found that the development of an intrinsic electric field due to the adsorption of atmospheric water molecules onto the film's surface significantly impairs the properties of domain retention and polarization stability. Nonetheless, vacuum heating efficiently counteracts the adverse effects of water adsorption, which restores the symmetric electrical characteristics and polarization stability. This work furnishes a novel perspective on previous extensive studies, demonstrating significant impact of surface water on HfO2‐based ferroelectrics, and establishes the design paradigm for the future evolution of HfO2‐based multifunctional electronic devices.
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institution OA Journals
issn 2198-3844
language English
publishDate 2024-12-01
publisher Wiley
record_format Article
series Advanced Science
spelling doaj-art-54f1bba67bad40908cfd86657bfb7cd22025-08-20T02:01:00ZengWileyAdvanced Science2198-38442024-12-011148n/an/a10.1002/advs.202410354Ambient Moisture‐Induced Self Alignment of Polarization in Ferroelectric HafniaLu‐Qi Wei0Zhao Guan1Wen‐Yi Tong2Wen‐Cheng Fan3Abliz Mattursun4Bin‐Bin Chen5Ping‐Hua Xiang6Genquan Han7Chun‐Gang Duan8Ni Zhong9Key Laboratory of Polar Materials and Devices Ministry of Education Shanghai Center of Brain‐inspired Intelligent Materials and Devices East China Normal University Shanghai 200241 ChinaKey Laboratory of Polar Materials and Devices Ministry of Education Shanghai Center of Brain‐inspired Intelligent Materials and Devices East China Normal University Shanghai 200241 ChinaKey Laboratory of Polar Materials and Devices Ministry of Education Shanghai Center of Brain‐inspired Intelligent Materials and Devices East China Normal University Shanghai 200241 ChinaKey Laboratory of Polar Materials and Devices Ministry of Education Shanghai Center of Brain‐inspired Intelligent Materials and Devices East China Normal University Shanghai 200241 ChinaKey Laboratory of Polar Materials and Devices Ministry of Education Shanghai Center of Brain‐inspired Intelligent Materials and Devices East China Normal University Shanghai 200241 ChinaKey Laboratory of Polar Materials and Devices Ministry of Education Shanghai Center of Brain‐inspired Intelligent Materials and Devices East China Normal University Shanghai 200241 ChinaKey Laboratory of Polar Materials and Devices Ministry of Education Shanghai Center of Brain‐inspired Intelligent Materials and Devices East China Normal University Shanghai 200241 ChinaSchool of Microelectronics Xidian University Xi'an 710071 ChinaKey Laboratory of Polar Materials and Devices Ministry of Education Shanghai Center of Brain‐inspired Intelligent Materials and Devices East China Normal University Shanghai 200241 ChinaKey Laboratory of Polar Materials and Devices Ministry of Education Shanghai Center of Brain‐inspired Intelligent Materials and Devices East China Normal University Shanghai 200241 ChinaAbstract The discovery of nanoscale ferroelectricity in hafnia (HfO2) has paved the way for next generation high‐density, non‐volatile devices. Although the surface conditions of nanoscale HfO2 present one of the fundamental mechanism origins, the impact of external environment on HfO2 ferroelectricity remains unknown. In this study, the deleterious effect of ambient moisture is examined on the stability of ferroelectricity using Hf0.5Zr0.5O2 (HZO) films as a model system. It is found that the development of an intrinsic electric field due to the adsorption of atmospheric water molecules onto the film's surface significantly impairs the properties of domain retention and polarization stability. Nonetheless, vacuum heating efficiently counteracts the adverse effects of water adsorption, which restores the symmetric electrical characteristics and polarization stability. This work furnishes a novel perspective on previous extensive studies, demonstrating significant impact of surface water on HfO2‐based ferroelectrics, and establishes the design paradigm for the future evolution of HfO2‐based multifunctional electronic devices.https://doi.org/10.1002/advs.202410354ferroelectric materialsHfO2‐basedHZOPFMwater
spellingShingle Lu‐Qi Wei
Zhao Guan
Wen‐Yi Tong
Wen‐Cheng Fan
Abliz Mattursun
Bin‐Bin Chen
Ping‐Hua Xiang
Genquan Han
Chun‐Gang Duan
Ni Zhong
Ambient Moisture‐Induced Self Alignment of Polarization in Ferroelectric Hafnia
Advanced Science
ferroelectric materials
HfO2‐based
HZO
PFM
water
title Ambient Moisture‐Induced Self Alignment of Polarization in Ferroelectric Hafnia
title_full Ambient Moisture‐Induced Self Alignment of Polarization in Ferroelectric Hafnia
title_fullStr Ambient Moisture‐Induced Self Alignment of Polarization in Ferroelectric Hafnia
title_full_unstemmed Ambient Moisture‐Induced Self Alignment of Polarization in Ferroelectric Hafnia
title_short Ambient Moisture‐Induced Self Alignment of Polarization in Ferroelectric Hafnia
title_sort ambient moisture induced self alignment of polarization in ferroelectric hafnia
topic ferroelectric materials
HfO2‐based
HZO
PFM
water
url https://doi.org/10.1002/advs.202410354
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