Exploring Optimal Dark Current Design in HgCdTe Infrared Barrier Detectors: A TCAD and Semianalytic Investigation

The dark current is a fundamental figure of merit to characterize the performance of high-sensitivity, low-noise mid- and far-infrared barrier photodetectors. In the context of HgCdTe barrier photodetectors, the trend is to use very low doping concentrations, in an attempt to minimize recombination...

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Main Authors: Marco Vallone, Matteo G. C. Alasio, Alberto Tibaldi, Francesco Bertazzi, Stefan Hanna, Anne Wegmann, Detlef Eich, Heinrich Figgemeier, Giovanni Ghione, Michele Goano
Format: Article
Language:English
Published: IEEE 2024-01-01
Series:IEEE Photonics Journal
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Online Access:https://ieeexplore.ieee.org/document/10368307/
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author Marco Vallone
Matteo G. C. Alasio
Alberto Tibaldi
Francesco Bertazzi
Stefan Hanna
Anne Wegmann
Detlef Eich
Heinrich Figgemeier
Giovanni Ghione
Michele Goano
author_facet Marco Vallone
Matteo G. C. Alasio
Alberto Tibaldi
Francesco Bertazzi
Stefan Hanna
Anne Wegmann
Detlef Eich
Heinrich Figgemeier
Giovanni Ghione
Michele Goano
author_sort Marco Vallone
collection DOAJ
description The dark current is a fundamental figure of merit to characterize the performance of high-sensitivity, low-noise mid- and far-infrared barrier photodetectors. In the context of HgCdTe barrier photodetectors, the trend is to use very low doping concentrations, in an attempt to minimize recombination processes. In the present work, through TCAD simulations, we delve deeper into the design of low-dark-current <inline-formula><tex-math notation="LaTeX">$p{\mathrm{B}}n$</tex-math></inline-formula> detectors, showing the possible existence of an optimum doping. This occurrence is investigated and interpreted also by means of closed-form expressions for the lifetimes, emphasizing the role of the interplay between Auger and Shockley-Read-Hall generation processes.
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institution Kabale University
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publishDate 2024-01-01
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spelling doaj-art-53f77eab5db44d5a9faf99c2b3ab33a42025-08-20T03:31:21ZengIEEEIEEE Photonics Journal1943-06552024-01-011611810.1109/JPHOT.2023.334554410368307Exploring Optimal Dark Current Design in HgCdTe Infrared Barrier Detectors: A TCAD and Semianalytic InvestigationMarco Vallone0https://orcid.org/0000-0003-3392-1810Matteo G. C. Alasio1https://orcid.org/0000-0002-5175-2769Alberto Tibaldi2https://orcid.org/0000-0002-0157-8512Francesco Bertazzi3https://orcid.org/0000-0002-9409-4807Stefan Hanna4https://orcid.org/0000-0003-3913-1043Anne Wegmann5Detlef Eich6https://orcid.org/0009-0008-2288-1108Heinrich Figgemeier7https://orcid.org/0009-0002-4860-7277Giovanni Ghione8https://orcid.org/0000-0002-2362-6458Michele Goano9https://orcid.org/0000-0003-2870-1549Dipartimento di Elettronica e Telecomunicazioni, Politecnico di Torino, Torino, ItalyDipartimento di Elettronica e Telecomunicazioni, Politecnico di Torino, Torino, ItalyDipartimento di Elettronica e Telecomunicazioni, Politecnico di Torino, Torino, ItalyDipartimento di Elettronica e Telecomunicazioni, Politecnico di Torino, Torino, ItalyAIM Infrarot-Module GmbH, Heilbronn, GermanyAIM Infrarot-Module GmbH, Heilbronn, GermanyAIM Infrarot-Module GmbH, Heilbronn, GermanyAIM Infrarot-Module GmbH, Heilbronn, GermanyDipartimento di Elettronica e Telecomunicazioni, Politecnico di Torino, Torino, ItalyDipartimento di Elettronica e Telecomunicazioni, Politecnico di Torino, Torino, ItalyThe dark current is a fundamental figure of merit to characterize the performance of high-sensitivity, low-noise mid- and far-infrared barrier photodetectors. In the context of HgCdTe barrier photodetectors, the trend is to use very low doping concentrations, in an attempt to minimize recombination processes. In the present work, through TCAD simulations, we delve deeper into the design of low-dark-current <inline-formula><tex-math notation="LaTeX">$p{\mathrm{B}}n$</tex-math></inline-formula> detectors, showing the possible existence of an optimum doping. This occurrence is investigated and interpreted also by means of closed-form expressions for the lifetimes, emphasizing the role of the interplay between Auger and Shockley-Read-Hall generation processes.https://ieeexplore.ieee.org/document/10368307/Modelingphotodetectorssemiconductor materialstheory and design
spellingShingle Marco Vallone
Matteo G. C. Alasio
Alberto Tibaldi
Francesco Bertazzi
Stefan Hanna
Anne Wegmann
Detlef Eich
Heinrich Figgemeier
Giovanni Ghione
Michele Goano
Exploring Optimal Dark Current Design in HgCdTe Infrared Barrier Detectors: A TCAD and Semianalytic Investigation
IEEE Photonics Journal
Modeling
photodetectors
semiconductor materials
theory and design
title Exploring Optimal Dark Current Design in HgCdTe Infrared Barrier Detectors: A TCAD and Semianalytic Investigation
title_full Exploring Optimal Dark Current Design in HgCdTe Infrared Barrier Detectors: A TCAD and Semianalytic Investigation
title_fullStr Exploring Optimal Dark Current Design in HgCdTe Infrared Barrier Detectors: A TCAD and Semianalytic Investigation
title_full_unstemmed Exploring Optimal Dark Current Design in HgCdTe Infrared Barrier Detectors: A TCAD and Semianalytic Investigation
title_short Exploring Optimal Dark Current Design in HgCdTe Infrared Barrier Detectors: A TCAD and Semianalytic Investigation
title_sort exploring optimal dark current design in hgcdte infrared barrier detectors a tcad and semianalytic investigation
topic Modeling
photodetectors
semiconductor materials
theory and design
url https://ieeexplore.ieee.org/document/10368307/
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