Quantitative study of local defects by pulsed eddy current testing

Pulsed eddy current testing (PECT) is a non-destructive evaluation technique capable of detecting defects within conductive materials; however, it often encounters challenges in accurately quantifying localized defects. This paper introduces a novel methodological approach and theoretical framework...

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Main Authors: Zhaoyang Li, Liang Dong
Format: Article
Language:English
Published: AIP Publishing LLC 2024-12-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0243754
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author Zhaoyang Li
Liang Dong
author_facet Zhaoyang Li
Liang Dong
author_sort Zhaoyang Li
collection DOAJ
description Pulsed eddy current testing (PECT) is a non-destructive evaluation technique capable of detecting defects within conductive materials; however, it often encounters challenges in accurately quantifying localized defects. This paper introduces a novel methodological approach and theoretical framework for the identification and quantification of such defects using a high-resolution focusing probe. The effective coverage area of the focusing probe is characterized by a two-dimensional Gaussian distribution model, enabling a detailed analysis of the probe’s interaction with the material under test. Analytical formulas are derived to describe the detection process, providing a foundation for subsequent error analysis. To optimize the detection process, four distinct types of error functions are formulated, and an optimization algorithm is employed to determine the parameters that minimize these error functions. This approach ensures that the probe settings are tailored to the specific characteristics of the defects being investigated. Simulation data are utilized to invert the probe parameters and extract defect information, thereby validating the feasibility and accuracy of the proposed method. The simulation results demonstrate that the method presented in this paper can effectively quantify defects with a high degree of precision. In conclusion, the research presented in this paper offers a significant advancement in the field of PECT by providing a robust method for the accurate quantification of localized defects. This contribution is expected to enhance the reliability and applicability of PECT in various industrial applications where the detection and quantification of defects are critical.
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spelling doaj-art-52fcf8faad9847fa9f609d97cbd824f22025-08-20T02:51:30ZengAIP Publishing LLCAIP Advances2158-32262024-12-011412125207125207-1110.1063/5.0243754Quantitative study of local defects by pulsed eddy current testingZhaoyang Li0Liang Dong1Shanghai Institute of Special Equipment Supervision and Inspection Technical Research, Shanghai 200062, People’s Republic of ChinaShanghai Institute of Special Equipment Supervision and Inspection Technical Research, Shanghai 200062, People’s Republic of ChinaPulsed eddy current testing (PECT) is a non-destructive evaluation technique capable of detecting defects within conductive materials; however, it often encounters challenges in accurately quantifying localized defects. This paper introduces a novel methodological approach and theoretical framework for the identification and quantification of such defects using a high-resolution focusing probe. The effective coverage area of the focusing probe is characterized by a two-dimensional Gaussian distribution model, enabling a detailed analysis of the probe’s interaction with the material under test. Analytical formulas are derived to describe the detection process, providing a foundation for subsequent error analysis. To optimize the detection process, four distinct types of error functions are formulated, and an optimization algorithm is employed to determine the parameters that minimize these error functions. This approach ensures that the probe settings are tailored to the specific characteristics of the defects being investigated. Simulation data are utilized to invert the probe parameters and extract defect information, thereby validating the feasibility and accuracy of the proposed method. The simulation results demonstrate that the method presented in this paper can effectively quantify defects with a high degree of precision. In conclusion, the research presented in this paper offers a significant advancement in the field of PECT by providing a robust method for the accurate quantification of localized defects. This contribution is expected to enhance the reliability and applicability of PECT in various industrial applications where the detection and quantification of defects are critical.http://dx.doi.org/10.1063/5.0243754
spellingShingle Zhaoyang Li
Liang Dong
Quantitative study of local defects by pulsed eddy current testing
AIP Advances
title Quantitative study of local defects by pulsed eddy current testing
title_full Quantitative study of local defects by pulsed eddy current testing
title_fullStr Quantitative study of local defects by pulsed eddy current testing
title_full_unstemmed Quantitative study of local defects by pulsed eddy current testing
title_short Quantitative study of local defects by pulsed eddy current testing
title_sort quantitative study of local defects by pulsed eddy current testing
url http://dx.doi.org/10.1063/5.0243754
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