Quantitative study of local defects by pulsed eddy current testing
Pulsed eddy current testing (PECT) is a non-destructive evaluation technique capable of detecting defects within conductive materials; however, it often encounters challenges in accurately quantifying localized defects. This paper introduces a novel methodological approach and theoretical framework...
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2024-12-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0243754 |
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| _version_ | 1850057192678359040 |
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| author | Zhaoyang Li Liang Dong |
| author_facet | Zhaoyang Li Liang Dong |
| author_sort | Zhaoyang Li |
| collection | DOAJ |
| description | Pulsed eddy current testing (PECT) is a non-destructive evaluation technique capable of detecting defects within conductive materials; however, it often encounters challenges in accurately quantifying localized defects. This paper introduces a novel methodological approach and theoretical framework for the identification and quantification of such defects using a high-resolution focusing probe. The effective coverage area of the focusing probe is characterized by a two-dimensional Gaussian distribution model, enabling a detailed analysis of the probe’s interaction with the material under test. Analytical formulas are derived to describe the detection process, providing a foundation for subsequent error analysis. To optimize the detection process, four distinct types of error functions are formulated, and an optimization algorithm is employed to determine the parameters that minimize these error functions. This approach ensures that the probe settings are tailored to the specific characteristics of the defects being investigated. Simulation data are utilized to invert the probe parameters and extract defect information, thereby validating the feasibility and accuracy of the proposed method. The simulation results demonstrate that the method presented in this paper can effectively quantify defects with a high degree of precision. In conclusion, the research presented in this paper offers a significant advancement in the field of PECT by providing a robust method for the accurate quantification of localized defects. This contribution is expected to enhance the reliability and applicability of PECT in various industrial applications where the detection and quantification of defects are critical. |
| format | Article |
| id | doaj-art-52fcf8faad9847fa9f609d97cbd824f2 |
| institution | DOAJ |
| issn | 2158-3226 |
| language | English |
| publishDate | 2024-12-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | AIP Advances |
| spelling | doaj-art-52fcf8faad9847fa9f609d97cbd824f22025-08-20T02:51:30ZengAIP Publishing LLCAIP Advances2158-32262024-12-011412125207125207-1110.1063/5.0243754Quantitative study of local defects by pulsed eddy current testingZhaoyang Li0Liang Dong1Shanghai Institute of Special Equipment Supervision and Inspection Technical Research, Shanghai 200062, People’s Republic of ChinaShanghai Institute of Special Equipment Supervision and Inspection Technical Research, Shanghai 200062, People’s Republic of ChinaPulsed eddy current testing (PECT) is a non-destructive evaluation technique capable of detecting defects within conductive materials; however, it often encounters challenges in accurately quantifying localized defects. This paper introduces a novel methodological approach and theoretical framework for the identification and quantification of such defects using a high-resolution focusing probe. The effective coverage area of the focusing probe is characterized by a two-dimensional Gaussian distribution model, enabling a detailed analysis of the probe’s interaction with the material under test. Analytical formulas are derived to describe the detection process, providing a foundation for subsequent error analysis. To optimize the detection process, four distinct types of error functions are formulated, and an optimization algorithm is employed to determine the parameters that minimize these error functions. This approach ensures that the probe settings are tailored to the specific characteristics of the defects being investigated. Simulation data are utilized to invert the probe parameters and extract defect information, thereby validating the feasibility and accuracy of the proposed method. The simulation results demonstrate that the method presented in this paper can effectively quantify defects with a high degree of precision. In conclusion, the research presented in this paper offers a significant advancement in the field of PECT by providing a robust method for the accurate quantification of localized defects. This contribution is expected to enhance the reliability and applicability of PECT in various industrial applications where the detection and quantification of defects are critical.http://dx.doi.org/10.1063/5.0243754 |
| spellingShingle | Zhaoyang Li Liang Dong Quantitative study of local defects by pulsed eddy current testing AIP Advances |
| title | Quantitative study of local defects by pulsed eddy current testing |
| title_full | Quantitative study of local defects by pulsed eddy current testing |
| title_fullStr | Quantitative study of local defects by pulsed eddy current testing |
| title_full_unstemmed | Quantitative study of local defects by pulsed eddy current testing |
| title_short | Quantitative study of local defects by pulsed eddy current testing |
| title_sort | quantitative study of local defects by pulsed eddy current testing |
| url | http://dx.doi.org/10.1063/5.0243754 |
| work_keys_str_mv | AT zhaoyangli quantitativestudyoflocaldefectsbypulsededdycurrenttesting AT liangdong quantitativestudyoflocaldefectsbypulsededdycurrenttesting |