Effect of thermal stress on the life of DC link capacitors for smart grid
Abstract Thermal stress is an important factor affecting the life of a DC link capacitor (DCLC). However, relevant studies on thermal stress mechanism directly influencing the lifetime of the capacitor are rarely reported. In this paper, the heat setting and thermal stress of DCLC has been analyzed,...
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Nature Portfolio
2025-02-01
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| Series: | Scientific Reports |
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| Online Access: | https://doi.org/10.1038/s41598-025-88522-2 |
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| author | Xiao-Wu Sun Ying Qiao Yin-Da Li Chong-Feng Cao Xiang-Ming Guo |
| author_facet | Xiao-Wu Sun Ying Qiao Yin-Da Li Chong-Feng Cao Xiang-Ming Guo |
| author_sort | Xiao-Wu Sun |
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| description | Abstract Thermal stress is an important factor affecting the life of a DC link capacitor (DCLC). However, relevant studies on thermal stress mechanism directly influencing the lifetime of the capacitor are rarely reported. In this paper, the heat setting and thermal stress of DCLC has been analyzed, and the relevant experimental platforms have been developed to evaluate the breakdown strength of DCLC at two heat setting temperatures (HSTs). Simultaneously, the life aging analysis of DCLC at different HSTs and the life aging tests at various temperatures were also executed to attain insights into the influence of thermal stress on the lifetime of DCLC. The results showed that the stress caused by heat setting and operating temperature influenced the breakdown voltage capability and the lifetime of DCLC. With an increase in HST by 5 °C, a step-increase in the withstand voltage capability of DCLC from 7,000 V to 7,200 V was observed that demonstrated an enhancement of 2.86% in the breakdown strength performance. Correspondingly, the lifetime of DCLC with a capacitance change rate of -3% enhanced from 1,500 h to 1,700 h. However, severe deterioration in the life span of DCLC from 4,200 h to 500 h was observed with an increasing operating temperature from 55 °C to 85 °C, respectively. The lifetime could be enhanced by increasing the HST as well as reducing the operating temperature. The presented results could be termed a harbinger for industrial production of high-performance DCLC with enhanced lifetime that augers well for high-power applications. |
| format | Article |
| id | doaj-art-527f6c7b65754de48e390191fffee5f7 |
| institution | Kabale University |
| issn | 2045-2322 |
| language | English |
| publishDate | 2025-02-01 |
| publisher | Nature Portfolio |
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| series | Scientific Reports |
| spelling | doaj-art-527f6c7b65754de48e390191fffee5f72025-02-02T12:24:44ZengNature PortfolioScientific Reports2045-23222025-02-0115111210.1038/s41598-025-88522-2Effect of thermal stress on the life of DC link capacitors for smart gridXiao-Wu Sun0Ying Qiao1Yin-Da Li2Chong-Feng Cao3Xiang-Ming Guo4Wuxi Power Filter Co., Ltd.Department of Electrical Engineering, Tsinghua UniversityWuxi Power Filter Co., Ltd.Wuxi Power Filter Co., Ltd.Wuxi Power Filter Co., Ltd.Abstract Thermal stress is an important factor affecting the life of a DC link capacitor (DCLC). However, relevant studies on thermal stress mechanism directly influencing the lifetime of the capacitor are rarely reported. In this paper, the heat setting and thermal stress of DCLC has been analyzed, and the relevant experimental platforms have been developed to evaluate the breakdown strength of DCLC at two heat setting temperatures (HSTs). Simultaneously, the life aging analysis of DCLC at different HSTs and the life aging tests at various temperatures were also executed to attain insights into the influence of thermal stress on the lifetime of DCLC. The results showed that the stress caused by heat setting and operating temperature influenced the breakdown voltage capability and the lifetime of DCLC. With an increase in HST by 5 °C, a step-increase in the withstand voltage capability of DCLC from 7,000 V to 7,200 V was observed that demonstrated an enhancement of 2.86% in the breakdown strength performance. Correspondingly, the lifetime of DCLC with a capacitance change rate of -3% enhanced from 1,500 h to 1,700 h. However, severe deterioration in the life span of DCLC from 4,200 h to 500 h was observed with an increasing operating temperature from 55 °C to 85 °C, respectively. The lifetime could be enhanced by increasing the HST as well as reducing the operating temperature. The presented results could be termed a harbinger for industrial production of high-performance DCLC with enhanced lifetime that augers well for high-power applications.https://doi.org/10.1038/s41598-025-88522-2DC link capacitorThermal stressLife aging testHeat settingWithstand voltage testBreakdown field strength |
| spellingShingle | Xiao-Wu Sun Ying Qiao Yin-Da Li Chong-Feng Cao Xiang-Ming Guo Effect of thermal stress on the life of DC link capacitors for smart grid Scientific Reports DC link capacitor Thermal stress Life aging test Heat setting Withstand voltage test Breakdown field strength |
| title | Effect of thermal stress on the life of DC link capacitors for smart grid |
| title_full | Effect of thermal stress on the life of DC link capacitors for smart grid |
| title_fullStr | Effect of thermal stress on the life of DC link capacitors for smart grid |
| title_full_unstemmed | Effect of thermal stress on the life of DC link capacitors for smart grid |
| title_short | Effect of thermal stress on the life of DC link capacitors for smart grid |
| title_sort | effect of thermal stress on the life of dc link capacitors for smart grid |
| topic | DC link capacitor Thermal stress Life aging test Heat setting Withstand voltage test Breakdown field strength |
| url | https://doi.org/10.1038/s41598-025-88522-2 |
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