Methodology for determining temperature dependences of the diffraction efficiency of two-layer two-relief microstructures in the framework of a rigorous coupled-wave analysis

Aiming to calculate the diffraction efficiency of diffractive optical elements with a two-layer microstructure and two internal sawtooth reliefs within the framework of the rigorous electromagnetic theory of diffraction, we propose an approach that involves calculating the efficiency of the element...

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Main Authors: A.I. Antonov, G.I. Greisukh
Format: Article
Language:English
Published: Samara National Research University 2025-06-01
Series:Компьютерная оптика
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Online Access:https://computeroptics.ru/eng/KO/Annot/KO49-3/490306e.html
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author A.I. Antonov
G.I. Greisukh
author_facet A.I. Antonov
G.I. Greisukh
author_sort A.I. Antonov
collection DOAJ
description Aiming to calculate the diffraction efficiency of diffractive optical elements with a two-layer microstructure and two internal sawtooth reliefs within the framework of the rigorous electromagnetic theory of diffraction, we propose an approach that involves calculating the efficiency of the element as a whole through the efficiency of each zone of the microstructure separately. This approach is a basis for a DE calculation method, which takes into account the normalized area of each zone of a two-layer microstructure, the temperature dependences of the depths of both reliefs and their refractive indices, as well as the local mutual displacement of the microstructure layers due to a difference in the thermal expansion coefficients of their materials. We present a mathematical apparatus of the proposed technique that minimizes the computational complexity and demonstrates its effectiveness by the example of calculating the diffraction efficiency of the diffractive element of an ultra-high-aperture refractive-diffraction athermal dual-band infrared lens. We show that due to variations in the operating temperature (from –40°C to + 60°C), the diffraction efficiency drops by no more than 7% over the entire operating spectral range (3.5 – 5.2 μm; 7.5 – 11.4 μm) with permissible angles of light incidence on the microstucture ranging from –14° to +14°.
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spelling doaj-art-52775bd32ff648ecacbf56c031ded31b2025-08-21T06:39:55ZengSamara National Research UniversityКомпьютерная оптика0134-24522412-61792025-06-0149339139810.18287/2412-6179-CO-1575Methodology for determining temperature dependences of the diffraction efficiency of two-layer two-relief microstructures in the framework of a rigorous coupled-wave analysisA.I. Antonov0G.I. Greisukh1Penza State University of Architecture and ConstructionPenza State University of Architecture and ConstructionAiming to calculate the diffraction efficiency of diffractive optical elements with a two-layer microstructure and two internal sawtooth reliefs within the framework of the rigorous electromagnetic theory of diffraction, we propose an approach that involves calculating the efficiency of the element as a whole through the efficiency of each zone of the microstructure separately. This approach is a basis for a DE calculation method, which takes into account the normalized area of each zone of a two-layer microstructure, the temperature dependences of the depths of both reliefs and their refractive indices, as well as the local mutual displacement of the microstructure layers due to a difference in the thermal expansion coefficients of their materials. We present a mathematical apparatus of the proposed technique that minimizes the computational complexity and demonstrates its effectiveness by the example of calculating the diffraction efficiency of the diffractive element of an ultra-high-aperture refractive-diffraction athermal dual-band infrared lens. We show that due to variations in the operating temperature (from –40°C to + 60°C), the diffraction efficiency drops by no more than 7% over the entire operating spectral range (3.5 – 5.2 μm; 7.5 – 11.4 μm) with permissible angles of light incidence on the microstucture ranging from –14° to +14°.https://computeroptics.ru/eng/KO/Annot/KO49-3/490306e.htmldiffractive optical elementtwo-layer microstructure with two internal sawtooth reliefsdiffraction efficiencyrigorous coupled-wave analysisfourier coefficientstemperature expansionthermo-optical constants
spellingShingle A.I. Antonov
G.I. Greisukh
Methodology for determining temperature dependences of the diffraction efficiency of two-layer two-relief microstructures in the framework of a rigorous coupled-wave analysis
Компьютерная оптика
diffractive optical element
two-layer microstructure with two internal sawtooth reliefs
diffraction efficiency
rigorous coupled-wave analysis
fourier coefficients
temperature expansion
thermo-optical constants
title Methodology for determining temperature dependences of the diffraction efficiency of two-layer two-relief microstructures in the framework of a rigorous coupled-wave analysis
title_full Methodology for determining temperature dependences of the diffraction efficiency of two-layer two-relief microstructures in the framework of a rigorous coupled-wave analysis
title_fullStr Methodology for determining temperature dependences of the diffraction efficiency of two-layer two-relief microstructures in the framework of a rigorous coupled-wave analysis
title_full_unstemmed Methodology for determining temperature dependences of the diffraction efficiency of two-layer two-relief microstructures in the framework of a rigorous coupled-wave analysis
title_short Methodology for determining temperature dependences of the diffraction efficiency of two-layer two-relief microstructures in the framework of a rigorous coupled-wave analysis
title_sort methodology for determining temperature dependences of the diffraction efficiency of two layer two relief microstructures in the framework of a rigorous coupled wave analysis
topic diffractive optical element
two-layer microstructure with two internal sawtooth reliefs
diffraction efficiency
rigorous coupled-wave analysis
fourier coefficients
temperature expansion
thermo-optical constants
url https://computeroptics.ru/eng/KO/Annot/KO49-3/490306e.html
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