Key Technologies in Developing Chip-Scale Hot Atomic Devices for Precision Quantum Metrology
Chip-scale devices harnessing the interaction between hot atomic ensembles and light are pushing the boundaries of precision measurement techniques into unprecedented territory. These advancements enable the realization of super-sensitive, miniaturized sensing instruments for measuring various physi...
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| Main Authors: | Huiyao Yu, Xuyuan Zhang, Jian Zhang, Zhendong Wu, Long Jiao, Kan Li, Wenqiang Zheng |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2024-08-01
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| Series: | Micromachines |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2072-666X/15/9/1095 |
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