Key Technologies in Developing Chip-Scale Hot Atomic Devices for Precision Quantum Metrology

Chip-scale devices harnessing the interaction between hot atomic ensembles and light are pushing the boundaries of precision measurement techniques into unprecedented territory. These advancements enable the realization of super-sensitive, miniaturized sensing instruments for measuring various physi...

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Bibliographic Details
Main Authors: Huiyao Yu, Xuyuan Zhang, Jian Zhang, Zhendong Wu, Long Jiao, Kan Li, Wenqiang Zheng
Format: Article
Language:English
Published: MDPI AG 2024-08-01
Series:Micromachines
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Online Access:https://www.mdpi.com/2072-666X/15/9/1095
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Summary:Chip-scale devices harnessing the interaction between hot atomic ensembles and light are pushing the boundaries of precision measurement techniques into unprecedented territory. These advancements enable the realization of super-sensitive, miniaturized sensing instruments for measuring various physical parameters. The evolution of this field is propelled by a suite of sophisticated components, including miniaturized single-mode lasers, microfabricated alkali atom vapor cells, compact coil systems, scaled-down heating systems, and the application of cutting-edge micro-electro-mechanical system (MEMS) technologies. This review delves into the essential technologies needed to develop chip-scale hot atomic devices for quantum metrology, providing a comparative analysis of each technology’s features. Concluding with a forward-looking perspective, this review discusses the future potential of chip-scale hot atomic devices and the critical technologies that will drive their advancement.
ISSN:2072-666X