Intrinsic Defect-Induced Local Semiconducting-to-Metallic Regions Within Monolayer 1T-TiS<sub>2</sub> Displayed by First-Principles Calculations and Scanning Tunneling Microscopy
Using density functional theory (DFT) and scanning tunneling microscopy (STM), the intrinsic point defects, formation energy, and electronic structure of 1T-TiS<sub>2</sub> were investigated. Defect systems include single-atom vacancies, interstitial and adatom additions, and direct atom...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2025-03-01
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| Series: | Crystals |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2073-4352/15/3/243 |
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