APA (7th ed.) Citation

Keeney, P. J., Coelho, P. M., & Haraldsen, J. T. Intrinsic Defect-Induced Local Semiconducting-to-Metallic Regions Within Monolayer 1T-TiS<sub>2</sub> Displayed by First-Principles Calculations and Scanning Tunneling Microscopy. MDPI AG.

Chicago Style (17th ed.) Citation

Keeney, P. J., P. M. Coelho, and J. T. Haraldsen. Intrinsic Defect-Induced Local Semiconducting-to-Metallic Regions Within Monolayer 1T-TiS<sub>2</sub> Displayed by First-Principles Calculations and Scanning Tunneling Microscopy. MDPI AG.

MLA (9th ed.) Citation

Keeney, P. J., et al. Intrinsic Defect-Induced Local Semiconducting-to-Metallic Regions Within Monolayer 1T-TiS<sub>2</sub> Displayed by First-Principles Calculations and Scanning Tunneling Microscopy. MDPI AG.

Warning: These citations may not always be 100% accurate.