Variable Bragg x-ray beam splitters
Beam splitters are utilized in a variety of advanced x-ray instruments and are essential for extending quantum optics techniques to x rays. A new fabrication method has produced thinned Bragg diffracting silicon devices with variable reflectivity and transmission coefficients and negligible absorpti...
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2025-04-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0257347 |
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| _version_ | 1850205470814371840 |
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| author | L. T. Powers M. Z. Kwasniewski S. M. Durbin |
| author_facet | L. T. Powers M. Z. Kwasniewski S. M. Durbin |
| author_sort | L. T. Powers |
| collection | DOAJ |
| description | Beam splitters are utilized in a variety of advanced x-ray instruments and are essential for extending quantum optics techniques to x rays. A new fabrication method has produced thinned Bragg diffracting silicon devices with variable reflectivity and transmission coefficients and negligible absorption losses. Diffraction measurements confirm that silicon continues to exhibit perfect crystal diffraction even for thicknesses below two microns. Devices are machined from standard wafers, with the thinned regions contained within the robust frame of an unperturbed crystal for ease of handling. |
| format | Article |
| id | doaj-art-4e7577c070184d1c8030dff36183a848 |
| institution | OA Journals |
| issn | 2158-3226 |
| language | English |
| publishDate | 2025-04-01 |
| publisher | AIP Publishing LLC |
| record_format | Article |
| series | AIP Advances |
| spelling | doaj-art-4e7577c070184d1c8030dff36183a8482025-08-20T02:11:05ZengAIP Publishing LLCAIP Advances2158-32262025-04-01154045231045231-510.1063/5.0257347Variable Bragg x-ray beam splittersL. T. Powers0M. Z. Kwasniewski1S. M. Durbin2Department of Physics and Astronomy, Purdue University, West Lafayette, Indiana 47907, USADepartment of Physics and Astronomy, Purdue University, West Lafayette, Indiana 47907, USADepartment of Physics and Astronomy, Purdue University, West Lafayette, Indiana 47907, USABeam splitters are utilized in a variety of advanced x-ray instruments and are essential for extending quantum optics techniques to x rays. A new fabrication method has produced thinned Bragg diffracting silicon devices with variable reflectivity and transmission coefficients and negligible absorption losses. Diffraction measurements confirm that silicon continues to exhibit perfect crystal diffraction even for thicknesses below two microns. Devices are machined from standard wafers, with the thinned regions contained within the robust frame of an unperturbed crystal for ease of handling.http://dx.doi.org/10.1063/5.0257347 |
| spellingShingle | L. T. Powers M. Z. Kwasniewski S. M. Durbin Variable Bragg x-ray beam splitters AIP Advances |
| title | Variable Bragg x-ray beam splitters |
| title_full | Variable Bragg x-ray beam splitters |
| title_fullStr | Variable Bragg x-ray beam splitters |
| title_full_unstemmed | Variable Bragg x-ray beam splitters |
| title_short | Variable Bragg x-ray beam splitters |
| title_sort | variable bragg x ray beam splitters |
| url | http://dx.doi.org/10.1063/5.0257347 |
| work_keys_str_mv | AT ltpowers variablebraggxraybeamsplitters AT mzkwasniewski variablebraggxraybeamsplitters AT smdurbin variablebraggxraybeamsplitters |